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Degradation of thin poly(lactic acid) films: Characterization by capacitance-voltage, atomic force microscopy, scanning electron microscopy and contact-angle measurements

机译：聚乳酸薄膜的降解：通过电容电压，原子力显微镜，扫描电子显微镜和接触角测量进行表征

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status: published

机译：状态：已发布

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Schusser S; Menzel S; Baecker M; Leinhos M; Poghossian A; Wagner Patrick Hermann; Schoening M. J;
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年度 2013
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1. Degradation of thin poly(lactic acid) films: Characterization by capacitance-voltage, atomic force microscopy, scanning electron microscopy and contact-angle measurements [J] . S. Schusser, S. Menzel, M. Backer, Electrochimica Acta . 2013,第Null期

机译：聚乳酸薄膜的降解：通过电容电压，原子力显微镜，扫描电子显微镜和接触角测量进行表征
2. Time-Resolved Study of Nanomorphology and Nanomechanic Change of Early-Stage Mineralized Electrospun Poly(lactic acid) Fiber by Scanning Electron Microscopy, Raman Spectroscopy and Atomic Force Microscopy [J] . Mengmeng Wang, Yin Cai, Bo Zhao, Nanomaterials . 2017,第8期

机译：扫描电镜，拉曼光谱和原子力显微镜对早期矿化电纺聚乳酸纤维纳米形态和纳米力学变化的时间分辨研究
3. Characterization of the RuS_2(100) surface by scanning tunneling microscopy, atomic force microscopy, and near-edge X-ray absorption fine structure measurements and electronic band structure calculations [J] . Kelty S.P., Chen J.G., Chianelli R.R., The journal of physical chemistry, B. Condensed matter, materials, surfaces, interfaces & biophysical . 1999,第22期

机译：通过扫描隧道显微镜，原子力显微镜和近边缘X射线吸收精细结构测量以及电子能带结构计算来表征RuS_2（100）表面
4. Characterisation of the surface morphology and electronic structure of YBa_2Cu_3O_(7-x) thin films by atomic force and scanning tunneling microscopies [C] . A G Fitzgerald, Y C Fan, H C Xu, Institute of Physics Electron Microscopy and Analysis Group conference . 1997

机译：YBa_2Cu_3O_（7-x）薄膜的表面形貌和电子结构的原子力和扫描隧道显微镜表征
5. Characterization of cylindrical nano-domains in thin films of polystyrene-poly(methyl methacrylate) diblock copolymer studied via atomic force microscopy [D] . Maire, Helene C. 2008

机译：原子力显微镜研究的聚苯乙烯-聚（甲基丙烯酸甲酯）二嵌段共聚物薄膜中圆柱纳米域的表征
6. Characterization of protein immobilization on nanoporous gold using atomic force microscopy and scanning electron microscopy [O] . Yih Horng Tan, John R. Schallom, N. Vijaya Ganesh, -1

机译：使用原子力显微镜上的纳米多孔金蛋白质固定的表征和扫描电子显微镜
7. Degradation of thin poly(lactic acid) films: Characterization by capacitance–voltage, atomic force microscopy, scanning electron microscopy and contact-angle measurements. [O] . Schusser S., Menzel S., Bäcker M., 2013

机译：聚乳酸薄膜的降解：通过电容-电压，原子力显微镜，扫描电子显微镜和接触角测量进行表征。

Degradation of thin poly(lactic acid) films: Characterization by capacitance-voltage, atomic force microscopy, scanning electron microscopy and contact-angle measurements

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