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Distinction between amorphous and healed planar deformation features in shocked quartz using composite color scanning electron microscope cathodoluminescence (SEM-CL) imaging

机译:复合彩色扫描电子显微镜阴极发光(SEM-CL)成像法区分冲击石英中的非晶态和复原平面变形特征

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摘要

Abstract–Planar deformation features (PDFs) in quartz are one of the most reliable and most widely used forms of evidence for hypervelocity impact. PDFs can be identified in scanning electron microscope cathodoluminescence (SEM-CL) images, but not all PDFs show the same CL behavior: there are nonluminescent and red luminescent PDFs. This study aims to explain the origin of the different CL emissions in PDFs. Focused ion beam (FIB) thin foils were prepared of specific sample locations selected in composite color SEMCL images and were analyzed in a transmission electron microscope (TEM). The FIB preparation technique allowed a direct, often one-to-one correlation between the CL images and the defect structure observed in TEM. This correlation shows that composite color SEM-CL imaging allows distinction between amorphous PDFs on one hand and healed PDFs and basal Brazil twins on the other: nonluminescent PDFs are amorphous, while healed PDFs and basal Brazil twins are red luminescent, with a dominant emission peak at 650 nm. We suggest that the red luminescence is the result of preferential beam damage along dislocations, fluid inclusions, and twin boundaries. Furthermore, a high-pressure phase (possibly stishovite) in PDFs can be detected in color SEM-CL images by its blue luminescence.
机译:摘要–石英的平面变形特征(PDFs)是超高速撞击的最可靠,使用最广泛的证据之一。可以在扫描电子显微镜阴极发光(SEM-CL)图像中识别PDF,但是并非所有PDF都显示相同的CL行为:有不发光和红色发光的PDF。这项研究旨在解释PDF中不同CL排放的来源。在复合彩色SEMCL图像中选择特定的样品位置制备聚焦离子束(FIB)薄箔,并在透射电子显微镜(TEM)中进行分析。 FIB制备技术允许CL图像与TEM中观察到的缺陷结构之间具有直接的,通常是一对一的关联。这种相关性表明,复合彩色SEM-CL成像一方面可以区分无定形PDF,另一方面可以区分被修复的PDF和基础巴西双胞胎:不发光的PDF是无定形的,而被修复的PDF和基础巴西双胞胎则呈红色发光,且具有发射峰。在650 nm我们建议红色发光是沿位错,流体包裹体和孪晶边界优先束损伤的结果。此外,可以通过彩色SEM-CL图像中的蓝色发光来检测PDF中的高压相(可能是菱沸石)。

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