Energy resolution and throughput of a new real timeuddigital pulse processing system for x-ray andudgamma ray semiconductor detectors

摘要

New generation spectroscopy systems have advanced towards digital pulse processingud(DPP) approaches. DPP systems, based on direct digitizing and processing of detector signals,udhave recently been favoured over analog pulse processing electronics, ensuring higher flexibility,udstability, lower dead time, higher throughput and better spectroscopic performance. In this work,udwe present the performance of a new real time DPP system for X-ray and gamma ray semiconductoruddetectors. The system is based on a commercial digitizer equipped with a custom DPP firmware,uddeveloped by our group, for on-line pulse shape and height analysis. X-ray and gamma ray spectraudmeasurements with cadmium telluride (CdTe) and germanium (Ge) detectors, coupled to resistivefeedbackudpreamplifiers, highlight the excellent performance of the system both at low and high rateudenvironments (up to 800 kcps). A comparison with a conventional analog electronics showed theudbetter high-rate capabilities of the digital approach, in terms of energy resolution and throughput.udThese results make the proposed DPP system a very attractive tool for both laboratory research andudfor the development of advanced detection systems for high-rate-resolution spectroscopic imaging,udrecently proposed in diagnostic medicine, industrial imaging and security screening.