Dual Diode Array and Fourier Transform Near Infrared Reflectance Spectrometer Calibrations for Composition Analysis of Single Soybean Seeds for Genetic Selection, Cross-Breeding Experiments

摘要

Experimental results of extensive evaluations of Diode-Array and FT-NIRS instruments are presented that aim at developing reliable and robust NIR calibrations for single soybean seed composition analysis on both Dual Diode Array and Fourier Transform NIR reflectance instruments. Single soybean seed, bulk, and powder calibrations were developed on four different NIRS spectrometer models that are commercially available.