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Kinematical two-dimensional multiple-diffraction intensity profiles. Application to $omega –psi$ scans of silicon and diamond obtained with synchrotron radiation

机译：运动二维多维衍射强度分布图。应用于通过同步加速器辐射获得的硅和金刚石的Ω– psi $扫描

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Rossmanith E.; Hupe A.; Kurtz R.; Schmidt H.; Krane H.-G.;
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年度 2001
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正文语种 eng
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1. Kinematical two-dimensional multiple-diffraction intensity profiles. Application to omega-psi scans of silicon and diamond obtained with synchrotron radiation [J] . Rossmanith E., Kurtz R., Schmidt H., Journal of Applied Crystallography . 2001,第2期

机译：运动二维多维衍射强度分布图。应用于同步辐射获得的硅和钻石的Ω-psi扫描
2. Kinematical two-dimensional multiple-diffraction intensity profiles. Application to omega-psi scans obtained with CuK alpha radiation [J] . Rossmanith E. Journal of Applied Crystallography . 2000,第6期

机译：运动二维多维衍射强度分布图。在通过CuK alpha辐射获得的Ω-psi扫描中的应用
3. Kinematics analysis of six-bar parallel mechanism and its applications in synchrotron radiation beamline [J] . Qipeng Lu, Yongjun Li, Zhongqi Peng Nuclear Instruments & Methods in Physics Research . 2012,第期

机译：六连杆并联机构的运动学分析及其在同步辐射束线中的应用
4. Applications of Synchrotron Radiation Scattering to Studies of Plasma Facing Components at Siberian Synchrotron and Terahertz Radiation Centre [C] . A.S. Arakcheev, A.I. Ancharov, V.M. Aulchenko, International Conference on Open Magnetic Systems for Plasma Confinement . 2016

机译：Synchrotron辐射散射对西伯利亚同步辐射辐射中心的等离子体面向浆料研究的应用
5. Design, development, and applications of image scanning ellipsometry for the measurement of thin film thickness profiles. [D] . Liu, An-Hong. 1994

机译：图像扫描椭圆仪的设计，开发和应用，用于测量薄膜厚度轮廓。
6. Synchrotron Bragg diffraction imaging characterization of synthetic diamond crystals for optical and electronic power device applications [O] . Thu Nhi Tran Thi, J. Morse, D. Caliste, -1

机译：光学和电子功率器件应用中合成金刚石晶体的同步布拉格衍射成像表征
7. Kinematical two-dimensional multiple-diffraction intensity profiles. Application to $omega - psi$ scans obtained with Cu K$lpha$ radiation [O] . Rossmanith Elisabeth 2000

机译：运动二维多维衍射强度分布图。应用到ω-通过Cu K $ alpha $辐射获得的 psi $扫描

Kinematical two-dimensional multiple-diffraction intensity profiles. Application to $omega –psi$ scans of silicon and diamond obtained with synchrotron radiation

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