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Measuring Three-Dimensional Strain and Structural Defects in a Single InGaAs Nanowire Using Coherent X-ray Multiangle Bragg Projection Ptychography

机译：使用相干x射线多角度布拉格投影ptychography测量单个InGaas纳米线中的三维应变和结构缺陷

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International audience

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Megan O. Hill; Irene Calvo-Almazan; Marc Allain; Martin V. Holt; Andrew Ulvestad; Julian Treu; Gregor Koblmüller; Chunyi Huang; Xiaojing Huang; Hanfei Yan; Evgeny Nazaretski; Yong S. Chu; G. Brian Stephenson; Virginie Chamard; Lincoln J. Lauhon; Stephan O. Hruszkewycz;
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年度 2018
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1. Measuring Three-Dimensional Strain and Structural Defects in a Single InGaAs Nanowire Using Coherent X-ray Multiangle Bragg Projection Ptychography [J] . Megan O. Hill, Irene Calvo-Almazan, Marc Allain, Nano letters . 2018,第2期

机译：使用相干X射线多成形布拉格投影PTYCHOMAGE测量单个InGaAs纳米线中的三维应变和结构缺陷
2. Imaging Local Polarization in Ferroelectric Thin Films by Coherent X-Ray Bragg Projection Ptychography [J] . S.O. Hruszkewycz, M.J. Highland, M. V. Holt, Physical review letters . 2013,第17期

机译：相干X射线布拉格投影分型技术成像铁电薄膜中的局部极化。
3. Framework for three-dimensional coherent diffraction imaging by focused beam x-ray Bragg ptychography [J] . Stephan O. Hruszkewycz, Martin V. Holt, Ash Tripathi, Optics Letters . 2011,第12期

机译：聚焦束X射线Bragg指纹图谱进行三维相干衍射成像的框架
4. Theoretical analysis of the strain mapping in a single core-shell nanowire by x-ray Bragg ptychography [C] . Dmitry Dzhigaev, Tomas Stankevic, Ilya Besedin, Conference on X-Ray Nanoimaging: Instruments and Methods . 2015

机译：通过X射线布拉格指纹图谱分析单核壳纳米线中的应变映射。
5. Three-dimensional reconstruction of blood vessel lumen from a single x-ray projection image. [D] . Erdemir, Erhan. 2010

机译：从单个X射线投影图像中三维重建血管腔。
6. Elemental Distribution and Structural Characterization of GaN/InGaN Core-Shell Single Nanowires by Hard X-ray Synchrotron Nanoprobes [O] . Eleonora Secco, Heruy Taddese Mengistu, Jaime Segura-Ruíz, 2019

机译：硬X射线同步加速器纳米探针对GaN / InGaN核壳单纳米线的元素分布和结构表征
7. Imaging Local Polarization in Ferroelectric Thin Films by Coherent X-Ray Bragg Projection Ptychography [O] . S. O. Hruszkewycz, M. J. Highland, M. V. Holt, 2013

机译：通过相干X射线布拉格投影PTYCHOMAGE成像X射线薄膜中的局部偏振

Measuring Three-Dimensional Strain and Structural Defects in a Single InGaAs Nanowire Using Coherent X-ray Multiangle Bragg Projection Ptychography

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