机译:评论Jongin Hong,Dae Sunng Yoon,Sung Kwan Kim,Sanghyo Kim,尤金Y.Pak和Kwangsoo No,Sanghyo Kim,Sanghyo Kim,Sanghyo Kim,Sanghyo Kim,Lab芯片,2005,5,270
机译:Jongin Hong,Dae Sung Yoon,Sung Kwan Kim,Tae Song Kim,Sanghyo Kim,Eugene Y.Pak和Kwangsoo No的评论“共面阻抗传感器的交流频率特性作为设计参数”,Lab Chip,2005,5,270
机译:Pontus Linderholm和Philippe Renaud对“共面阻抗传感器的交流频率特性作为设计参数的评论”,实验室芯片,2005,5,DOI:10.1039 / b512077b