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Environmental Transmission Electron Microscopy Using a Conventional TEM and a Gas Injection-Specimen Heating Holder

机译：使用常规TEM和气体注入样本加热支架的环境透射电子显微镜

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T Kamino; T Yaguchi; A Watabe; H Saka; K Kishita;
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年度 2006
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1. A novel sample holder allowing atomic force microscopy on transmission electron microscopy specimen grids: repetitive, direct correlation between AFM and TEM images. [J] . Lin AC, Goh MC Journal of Microscopy . 2002,第Pta2期

机译：一种新颖的样品架，允许在透射电子显微镜标本网格上进行原子力显微镜检查：AFM和TEM图像之间的重复直接相关。
2. A novel sample holder allowing atomic force microscopy on transmission electron microscopy specimen grids: repetitive, direct correlation between AFM and TEM images [J] . Lin AC., Goh MC. Journal of Microscopy . 2002,第Pta2期

机译：一种新颖的样品架，允许在透射电子显微镜标本网格上进行原子力显微镜检查：AFM和TEM图像之间的重复直接相关
3. CFD modelling of gas flow characteristics for the gas-heating holder in environmental transmission electron microscope [J] . Zhao Zhijian, Wang Zhiyong, Wang Dan, The Canadian Journal of Chemical Engineering . 2019,第3期

机译：环形加热架气流特性的CFD建模电子显微镜
4. Parallel Transmission Electron and Atomic Force Microscopy: Direct andRepetitive Correlation of TEM and AFM images by a Novel Sample Holder [C] . Alvin C. Lin, M. Cynthia Goh Microscopy Society of America annual meeting . 2002

机译：并联透射电子和原子力显微镜：通过新型样品架的TEM和AFM图像的直接和释放相关性
5. A transmission electron microscopy (TEM) study of soot, carbon nanotubes, and related fullerene nanopolyhedra in common fuel-gas combustion sources. [D] . Soto, Karla Fabiola. 2005

机译：透射电子显微镜（TEM）研究常见燃料-燃气燃烧源中的烟灰，碳纳米管和相关的富勒烯纳米多面体。
6. Fabrication of tin-filled carbon nanofibres by microwave plasma vapour deposition and their in situ heating observation by environmental transmission electron microscopy [O] . Tomoharu Tokunaga, Takumi Kanematsu, Takahumi Ito, 2013

机译：微波等离子体气相沉积法制备锡填充碳纳米纤维及其环境透射电镜原位加热观察
7. Specimen heating holder for high temperature high resolution transmission electron microscopy and its application. [O] . Takeo KAMINO, Kishio HIDAKA 2000

机译：用于高温高分辨率透射电子显微镜的试样加热保持器及其应用。
8. Structural characterization and gas reactions of small metal particles by high resolution in-situ TEM (Transmission Electron Microscopy) and TED (Transmission Electron Diffraction) [R] . Heinemann, K. 1987

机译：通过高分辨率原位TEm（透射电子显微镜）和TED（透射电子衍射）对小金属颗粒进行结构表征和气体反应

Environmental Transmission Electron Microscopy Using a Conventional TEM and a Gas Injection-Specimen Heating Holder

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