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Nanoscale Membrane Buds Induced by CTxB-GM1 in One Component Bilayer Detected by Polarized Localization Microscopy (PLM)

机译：CTXB-GM1在通过偏振定位显微镜（PLM）检测的一种组分双层中的CTXB-GM1诱导的纳米级膜芽（PLM）

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Abir Kabbani; XinXin Woodward; Christopher V. Kelly;
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年度 2017
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1. Nanoscale Membrane Budding Induced by CTxB and Detected via Polarized Localization Microscopy [J] . Abir M. Kabbani, Christopher V. Kelly Biophysical Journal . 2017,第8期

机译：CTXB诱导的纳米级膜芽面，通过偏振定位显微镜检测
2. The Detection of Nanoscale Membrane Bending with Polarized Localization Microscopy [J] . Abir M. Kabbani, Christopher V. Kelly Biophysical Journal . 2017,第8期

机译：用偏振定位显微镜检测纳米透视膜弯曲的检测
3. Membrane order parameters for interdigitated lipid bilayers measured via polarized total-internal-reflection fluorescence microscopy [J] . NgoA.T., JakubekZ.J., LuZ., Biochimica et biophysica acta. Biomembranes . 2014,第11期

机译：通过偏振全内反射荧光显微镜测量指状脂质双层的膜序参数
4. Use of electric force microscopy to detect process-induced, nanoscale dielectric damage of low k oxides [C] . Gross T.S., Soucy K.G., Andideh E. Interconnect Technology Conference, 2001. Proceedings of the IEEE 2001 International . 2001

机译：使用电力显微镜检测低k氧化物的过程诱导的纳米级介电损伤
5. Nanoscale Chemical Characterization with Photo-induced Force Microscopy [D] . Khan, Ryan Muhammad. 2020

机译：纳米级化学表征与光诱导的力显微镜
6. Nanoscale Membrane Budding Induced by CTxB and Detected via Polarized Localization Microscopy [O] . Abir M. Kabbani, Christopher V. Kelly 2017

机译：CTxB诱导并通过偏振定位显微镜检测的纳米级膜萌芽。
7. Nanoscale Membrane Budding Induced by CTxB and Detected via Polarized Localization Microscopy [O] . Abir M. Kabbani, Christopher V. Kelly 2017

机译：CTXB诱导的纳米级膜芽面，通过偏振定位显微镜检测
8. Aromatic Amino Acids and Ultraviolet Induced Photo-Electric Effects in Bilayer Membranes [R] . Huebner, J. S., Arrieta, R. T., Millar, D. B. 1982

机译：双层膜中芳香族氨基酸和紫外诱导的光电效应

Nanoscale Membrane Buds Induced by CTxB-GM1 in One Component Bilayer Detected by Polarized Localization Microscopy (PLM)

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