A stepwise transmission/reflection multiline-based algorithm for broadband permittivity measurements of dielectric materials

摘要

Transmission/reflection (T/R) techniques for measuring dielectric material's complex permittivity are broadband but have usually problems when the length of the tested sample is a multiple of λ/2. In this paper, we apply a stepwise scheme to a multiline T/R measurement method that solve those ambiguity problems thus allowing wideband and accurate permittivity estimation.