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Crystallography-Derived Youngs Modulus and Tensile Strength of AlN Nanowires as Revealed by in Situ Transmission Electron Microscopy

机译：通过原位透射电子显微镜透露，晶体学衍生的ALN纳米线的模量和拉伸强度

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1. Crystallography-Derived Young's Modulus and Tensile Strength of AIN Nanowires as Revealed by in Situ Transmission Electron Microscopy [J] . Firestein Konstantin L., Kvashnin Dmitry G., Fernando Joseph F. S., Nano letters . 2019,第3期

机译：通过原位透射电子显微镜透露，结晶术术的杨氏模量和抗拉强度的AIN纳米线
2. Individual boron nanowire has ultra-high specific young's modulus and fracture strength as revealed by in situ transmission electron microscopy [J] . Liu F., Tang D.-M., Gan H., ACS nano . 2013,第11期

机译：原位透射电子显微镜显示，单个硼纳米线具有极高的比杨氏模量和断裂强度
3. Individual boron nanowire has ultra-high specific young's modulus and fracture strength as revealed by in situ transmission electron microscopy [J] . Liu F., Tang D.-M., Gan H., ACS nano . 2013,第11期

机译：原位透射电子显微镜显示，单个硼纳米线具有极高的比杨氏模量和断裂强度
4. Ultrafast Lithiation of Si Nanowires Revealed with In-Situ Transmission Electron Microscopy [C] . Xiao Hua Liu, Li Qiang Zhang, Scott X. Mao, International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting . 2011

机译：原位透射电子显微镜揭示了硅纳米线的超快锂化
5. Growth of Gallium Nitride Nanowires: A Study Using In Situ Transmission Electron Microscopy. [D] . Diaz Rivas, Rosa Estela. 2010

机译：氮化镓纳米线的生长：使用原位透射电子显微镜的研究。
6. In Situ Transmission Electron Microscopy Analysisof Aluminum–Germanium Nanowire Solid-State Reaction [O] . Khalil El hajraoui, Minh Anh Luong, Eric Robin, -1

机译：原位透射电子显微镜分析铝锗纳米线固相反应研究
7. Youngs Modulus and Tensile Strength of Ti3C2 MXene Nanosheets As Revealed by In Situ TEM Probing, AFM Nanomechanical Mapping, and Theoretical Calculations [O] . -1

机译：TI3C2 MXENENOELS的杨氏模量和拉伸强度，如原位TEM探测，AFM纳米力学映射和理论计算所揭示的

Crystallography-Derived Youngs Modulus and Tensile Strength of AlN Nanowires as Revealed by in Situ Transmission Electron Microscopy

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