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Fabrication and Characterization of Photoconductive AlGaN Detectors/Structural Characterization of SiC Wafers

机译：光电导液探测器的制造与表征SiC晶片的结构特征

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Marek Skowronski;
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年度 2001
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1. Recombination lifetime characterization and mapping of silicon wafers and detectors using the microwave photoconductivity decay (mu PCD) technique [J] . Harkonen J, Tuovinen E, Li Z, Materials science in semiconductor processing . 2006,第1a3期

机译：使用微波光电导衰减（mu PCD）技术对硅晶片和检测器进行复合寿命表征和绘图
2. Comparative study on the mechanical, tribological, morphological and structural properties of vortex casting processed, Al–SiC–Cr hybrid metal matrix composites for high strength wear-resistant applications: Fabrication and characterizations [J] . Jatinder Kumar, Dilbag Singh, Nirmal S. Kalsi, Journal of Materials Research and Technology . 2020,第6期

机译：涡流铸造加工机械，摩擦学，形态学和结构性能的比较研究，高强度耐磨应用的Al-SiC-Cr杂交金属基复合材料：制造与特征
3. Fabrication and characterization of an AlGaN/PZT detector [J] . Zhang Yan, Sun Jinglan, Wang Nili, Journal of Semiconductors . 2010,第12期

机译：AlGaN / PZT检测器的制造与表征
4. Structural characterization of 3C-SiC films grown on Si layers wafer bonded to polycrystalline SiC substrates [C] . R.L. Myers, K.D. Hobart, M. Twigg, Symposium Proceedings vol.815; Symposium on Silicon Carbide 2004 - Materials, Processing and Devices; 20040414-15; San Francisco,CA(US) . 2004

机译：在与多晶SiC衬底键合的硅层上生长的3C-SiC膜的结构表征
5. Fabrication and characterization of compact high resolution radiation detectors based on 4h-sic n-type epilayer and cdznte. [D] . Zavalla Mendoza, Kelvin J. 2013

机译：基于4h-sic n型外延层和cdznte的紧凑型高分辨率辐射探测器的制造与表征。
6. The Fabrication and Characterization of Ni/4H-SiC Schottky Diode Radiation Detectors with a Sensitive Area of up to 4 cm2 [O] . Lin-Yue Liu, Ling Wang, Peng Jin, 2017

机译：Ni / 4H-SiC肖特基二极管辐射探测器的制造与表征其敏感面积高达4 cm2
7. Fabrication and Characterization of n-ZnO/p-AlGaN Heterojunction Light-Emitting Diodes on 6H-SiC Substrates [O] . Alivov, Y. I., Kalinina, E. V., Cherenkov, A. E., 2012

机译：6H-SiC衬底上n-ZnO / p-AlGaN异质结发光二极管的制备与表征
8. Fabrication and Characterization of Photoconductive AlGaN Detectors/ Structural Characterization of SiC Wafers [R] . Skowronski, M. 2001

机译：光电导alGaN探测器的制备和表征/ siC晶片的结构表征

Fabrication and Characterization of Photoconductive AlGaN Detectors/Structural Characterization of SiC Wafers

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