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Coupling to devices in electrically large cavities, or why classical EMC evaluation techniques are becoming obsolete

机译：耦合到电力大腔内的装置，或者古典EMC评估技术变得过时

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J.M. Ladbury; T.H. Lehman; G.H. Koepke;
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1. An Efficient Hybrid Method for Calculating the EMC Coupling to a Device on a Printed Circuit Board inside a Cavity by a Wire Penetrating an Aperture [J] . Chatrpol Lertsirimit, David R. Jackson, Donald R. Wilton Electromagnetics . 2005,第7a8期

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2. Modeling Method of Stray Magnetic Couplings in an EMC Filter for Power Electronic Devices [J] . Takashi Masuzawa, Eckart Hoene, Stefan Hoffmann, IEEJ Journal of Industry Applications . 2015,第6期

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3. CMOS imagers can be charge-coupled: techniques exist to add charge coupling to CMOS imagers, bringing the low-noise advantages of charge coupling to low-cost CMOS devices [J] . James Janesick Laser Focus World: The Magazine for the Photonics & Optoelectronics Industry . 2003,第1期

机译：CMOS成像器可以进行电荷耦合：现有的技术可以增加CMOS成像器的电荷耦合，从而为低成本CMOS器件带来电荷耦合的低噪声优势
4. Coupling to devices in electrically large cavities, or why classical EMC evaluation techniques are becoming obsolete [C] . Ladbury J.M., Lehman T.H., Koepke G.H. Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on . 2002

机译：耦合到电大腔中的设备，或者为什么经典的EMC评估技术变得过时
5. Novel Electrical Measurement Techniques for Silicon Devices. [D] . Elhami Khorasani, Arash. 2015

机译：硅器件的新型电测量技术。
6. Symposium on Problems in Evaluating the Blood Compatibility of Biomaterials: Discussion of Paper by Bert K. Kusserow M.D.: Use of Pathologic Techniques in the Evaluation of Emboli from Prosthetic Devices [O] . Pierre M. Galletti 1972

机译：关于评估生物材料血液相容性问题的专题讨论会：医学博士Bert K. Kusserow的论文讨论：利用病理技术评估人工器械栓塞
7. A photonic quantum gate based on electrically controlled strong cavity coupling between a single nanocrystal quantum dot and an ultra-high Q silica micro-cavity [O] . Fernee Mark J., Rubinsztein-Dunlop Halina 2006

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8. Evaluation of Potting Compounds by Electrical Resistivity Techniques Using the Continuous Current Monitoring Device (CCMD) [R] . Lequin, D. S., Ezell, R. D. 1973

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Coupling to devices in electrically large cavities, or why classical EMC evaluation techniques are becoming obsolete

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