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Correction to “Evaluating the Internal Structure of Core–Shell Nanoparticles Using X-ray Photoelectron Intensities and Simulated Spectra”

机译：“使用X射线光电电阻和模拟光谱评估核 - 壳纳米粒子内部结构的”评价核心 - 壳纳米粒子的内部结构“

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M. Chudzicki; W. S. M. Werner; A. G. Shard; Y.-C. Wang; D. G. Castner; C. J. Powell;
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1. Evaluating the Internal Structure of Core Shell Nanoparticles Using X-ray Photoelectron Intensities and Simulated Spectra (vol 119, pg 17687, 2015) [J] . Chudzicki M., Werner W. S. M., Shard A. G., The journal of physical chemistry, C. Nanomaterials and interfaces . 2016,第4期

机译：使用X射线光电子强度和模拟光谱评估核壳纳米粒子的内部结构（vol 119，pg 17687，2015）
2. Evaluating the Internal Structure of Core-Shell Nanoparticles Using X-ray Photoelectron Intensities and Simulated Spectra [J] . Chudzicki M., Werner W. S. M., Shard A. G., The journal of physical chemistry, C. Nanomaterials and interfaces . 2015,第31期

机译：使用X射线光电子强度和模拟光谱评估核壳纳米粒子的内部结构
3. Peak shape analysis of Ag 3d core-level X-ray photoelectron spectra of Au@Ag core-shell nanoparticles using an asymmetric Gaussian-Lorentzian mixed function [J] . Maenosono S., Lee J., Dao A.T.N., Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films . 2012,第13期

机译：非对称高斯-洛仑兹混合函数分析Au @ Ag核壳纳米粒子Ag 3d核能级X射线光电子能谱峰形
4. Modelling of angle-resolved X-ray photoelectron spectroscopy (ARXPS) intensity ratios for nanocharacterisation of closely packed shell-core nanofibres [C] . Jian Wang, Peter J. Cumpson Instrumentation, Metrology, and Standards for Nanomanufacturing; Proceedings of SPIE-The International Society for Optical Engineering; vol.6648 . 2007

机译：角分辨X射线光电子能谱（ARXPS）强度比建模，用于紧密堆积的壳核纳米纤维的纳米表征
5. Structural, Optical and Photo-Electrochemical Properties of H:TiO2 Nanoparticle, TiO2-MoS2 Nanocomposite and TiO2-BiVo4 Core-Shell Nanoparticle Structures [D] . Mehta, Manan. 2020

机译：H：TiO2纳米粒子，TiO2-MOS2纳米复合材料和TiO2-BIVO4核心壳纳米粒子结构的结构，光学和光电化学性质
6. Evaluating the Internal Structure of Core-Shell Nanoparticles Using X-ray Photoelectron Intensities and Simulated Spectra [O] . M. Chudzicki, W.S.M. Werner, A.G. Shard, -1

机译：使用X射线光电子强度和模拟光谱评估核壳纳米粒子的内部结构
7. Evaluation of Two Methods for Determining Shell Thicknesses of Core–Shell Nanoparticles by X-ray Photoelectron Spectroscopy [O] . C. J. Powell, W. S. M. Werner, A. G. Shard, 2016

机译：X射线光电子谱法测定核 - 壳纳米粒子壳厚度的两种方法

Correction to “Evaluating the Internal Structure of Core–Shell Nanoparticles Using X-ray Photoelectron Intensities and Simulated Spectra”

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