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Automatic Film Thickness Measurement System for Inkjet-Based Color Filters Based on Three-Wavelength Single-Shot Interferometry

机译：基于三波长单发离干涉法的喷墨基滤色器自动膜厚度测量系统

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Katsuichi KITAGAWA; Hiroki SUGIHARA; Tatsuhiko TSUBOI; Kazuyoshi SUZUKI; Masafumi OTSUKI;
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年度 2012
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1. An automatic system for real-time evaluation of EHD film thickness and shape based on the colorimetric interferometry [J] . Martin Hartl, Ivan Krupka, Radek Poliscuk, Tribology Transactions . 1999,第2期

机译：基于比色干涉仪的EHD薄膜厚度和形状实时评估自动系统
2. Thin-film thickness profile measurement by three-wavelength interference color analysis [J] . Katsuichi Kitagawa Applied optics . 2013,第10期

机译：三波长干涉色分析法测量薄膜厚度
3. A Generalized Differential Colorimetric Interferometry Method: Extension to the Film Thickness Measurement of Any Point Contact Geometry [J] . Wheeler Jean-David, Molimard Jerome, Devaux Nicolas, Tribology Transactions . 2018,第4期

机译：广义差分比色干涉测量方法：延伸到任何点接触几何的膜厚度测量
4. Surface and thickness measurement of a transparent film using three-wavelength interferometry [C] . K. Kitagawa International Conference of the European Society for Precision Engineering Nanotechnology . 2014

机译：使用三波长干涉测量透明膜的表面和厚度测量
5. LUBRICANT FILM THICKNESS MEASUREMENTS IN AXISYMMETRIC STRETCH FORMING USING OPTICAL INTERFEROMETRY [D] . HECTOR, LOUIS G., JR. 1987

机译：光学干涉法测量轴对称拉伸中润滑剂薄膜的厚度
6. An imaging system integrating optical coherence tomography and interferometry for in vivo measurement of the thickness and dynamics of the tear film [O] . Yuqiang Bai, William Ngo, Boyu Gu, 2018

机译：集成光学相干断层扫描和干涉术的成像系统用于体内测量泪膜的厚度和动力学
7. Optimum Wavelength Selection to Extend the Unambiguous Measurement Range of the Three-wavelength Single-shot Interferometry [O] . Katsuichi KITAGAWA 2014

机译：最佳波长选择，以延长三波长单射干涉测量法的明确测量范围
8. Thickness Measurements of Silicon Films Using Partial Coherence Interferometry [R] . McLandrich, M. N., Albares, D. J. 1991

机译：采用部分相干干涉法测量硅薄膜厚度

Automatic Film Thickness Measurement System for Inkjet-Based Color Filters Based on Three-Wavelength Single-Shot Interferometry

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