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Crystal Growth and Luminescence Properties of Dy3+ and Ge4+ Co-Doped Bi4Si3O12 Single Crystals for High Power Warm White LED

机译:DY3 +和GE4 + Co-掺杂Bi4Si3O12单晶体的晶体生长和发光性能,用于高功率暖白LED

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摘要

Φ1 inch Dy3+ and Ge4+ co-doped bismuth silicate (Bi4Si3O12, BSO) single crystals with the length of 80–100 mm were successfully grown by Bridgman method. They are transparent, free of cracks and inclusions. The white residual at the top parts of BSO crystals disappears with co-doping 1 mol% Dy3+ and more than 3 mol% Ge4+. The FWHM values of X-ray rocking curves shows 1%Dy,3%Ge:BSO crystal possesses high crystallization quality. The intrinsic emission peak of BSO and the characteristic emission peaks of Dy3+ ions are weakened with increasing the doping concentration of Ge4+. 1 mol% Dy3+ and 3 mol% Ge4+ are the optimal concentrations due to high crystallization quality and moderate emission intensity. The CIE coordinates and CCT values shift towards warmer white light region with increased Ge4+ co-doping. The CCT values are close to the ideal value of 3000 K for warm white light when 1%Dy,3%Ge:BSO crystal is excited by various UV light. Increasing the temperature from 298 K to 573 K leads the luminescence lifetime to decrease from 659 μs to 645 μs. More than 95% and 80% photoluminescence intensity at room temperature is still retained at 423 K and 573 K respectively. Dy,Ge:BSO crystals are potential candidates for fabricating high power warm WLEDs.
机译:Φ1英寸Dy3 +的和GE4 +共掺杂的硅酸铋(Bi4Si3O12,BSO)与80-100毫米的长度单晶成功地被布里奇曼法生长。它们是透明的,无裂纹和夹杂物。将白色残留在晶体BSO的顶部部分与共掺杂1摩尔%的Dy3 +的和超过3%(摩尔)GE4 +消失。的X射线摇摆曲线示出了FWHM值的1%的Dy,3%的Ge:BSO晶体具有高的结晶质量。 BSO和Dy3 +的离子的特征发射峰的固有发射峰被减弱随GE4 +的掺杂浓度。 1摩尔%Dy3 +的和3%(摩尔)GE4 +是最佳浓度,由于高结晶质量和适中的发射强度。的CIE坐标和CCT值朝着较暖的白色光区域转移具有增加GE4 +共掺杂。的CCT值接近3000°K的对暖白光理想值时1%的Dy,3%的Ge:BSO晶体是由不同的UV光激发。从298K的温度升高到573K的带领发光寿命减少从659微秒到645微秒。在室温下超过95%和80%的光致发光强度仍然在423K和573K的分别保持。镝,葛:BSO晶体制造高功率温暖WLED的潜在候选人。

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