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Direct Observation of the Outermost Surfaces of Mesoporous Silica Thin Films by High Resolution Ultralow Voltage Scanning Electron Microscopy

机译：通过高分辨率超高压扫描电子显微镜直接观察中孔二氧化硅薄膜的最外表面

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1. Structural study of highly ordered mesoporous silica thin films and replicated Pt nanowires by high-resolution scanning electron microscopy (HRSEM) [J] . Wu CW, Yamauchi Y, Ohsuna T, Journal of Materials Chemistry: An Interdisciplinary Journal dealing with Synthesis, Structures, Properties and Applications of Materials, Particulary Those Associated with Advanced Technology . 2006,第30期

机译：高分辨率扫描电镜（HRSEM）研究高度有序的介孔二氧化硅薄膜和复制的Pt纳米线
2. Direct Imaging of Surface Topology and Pore System of Ordered Mesoporous Silica (MCM-41, SBA-15, and KIT-6) and Nanocast Metal Oxides by High Resolution Scanning Electron Microscopy [J] . Harun Tueysuez, Christian W. Lehmann, Hans Bongard, Journal of the American Chemical Society . 2008,第34期

机译：通过高分辨率扫描电子显微镜对有序介孔二氧化硅（MCM-41，SBA-15和KIT-6）和纳米浇铸金属氧化物的表面拓扑和孔系统进行直接成像
3. Radiation damage of mesoporous silica thin films monitored by X-ray reflectivity and scanning electron microscopy [J] . Dourdain S., Deschanels X., Toquer G., Journal of Nuclear Materials: Materials Aspects of Fission and Fusion . 2012,第1a3期

机译：X射线反射率和扫描电子显微镜监测介孔二氧化硅薄膜的辐射损伤
4. Direct Observation of Three Dimensional Mesoporous Structure by Scanning Electron Microscopy (SEM): SBA-15 Silica and CMK-5 Carbon [C] . Shunai Che, Kristina Lund, Takashi Tatsumi, Asia-Pacific Congress on Catalysis . 2003

机译：通过扫描电子显微镜（SEM）直接观察三维中孔结构：SBA-15二氧化硅和CMK-5碳
5. Structure Study of Magnetic Thin Films for Voltage Controlled Spintronics by Scanning Transmission Electron Microscopy Experiment and Density Functional Theory Calculations [D] . Sun, Congli. 2018

机译：扫描电子显微镜实验及密度泛函理论计算的电压控制自旋电子学磁性薄膜的结构研究
6. Direct observation of iron-induced conformational changes of mitochondrial DNA by high-resolution field-emission in-lens scanning electron microscopy. [O] . M Yaffee, P Walter, C Richter, 1996

机译：高分辨率场发射透镜内扫描电子显微镜直接观察铁诱导的线粒体DNA构象变化。
7. Publisher’s Note: “Direct observation and analysis of yolk-shell materials using low-voltage high-resolution scanning electron microscopy: Nanometal-particles encapsulated in metal-oxide, carbon, and polymer” [APL Mater. 2, 113317 (2014)] [O] . Shunsuke Asahina, Mitsuo Suga, Hideyuki Takahashi, 2015

机译：出版商注：“使用低压高分辨率扫描电子显微镜直接观察和分析蛋黄壳材料：纳米金属颗粒包裹在金属氧化物，碳和聚合物中”[apL mater。 2,113317（2014）]
8. Interfacial and surface properties of thin Fe and Gd films grown on W(110) as studied by scanning tunneling microscopy, site-resolved photoelectron diffraction, and spin polarized photoelectron diffraction [R] . Tober, E. D. 1997

机译：通过扫描隧道显微镜，位点分辨光电子衍射和自旋偏振光电子衍射研究在W（110）上生长的薄Fe和Gd薄膜的界面和表面性质

Direct Observation of the Outermost Surfaces of Mesoporous Silica Thin Films by High Resolution Ultralow Voltage Scanning Electron Microscopy

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