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Evolution of Scintillation and Electrical Characteristics of AlGaN Double-Response Sensors During Proton Irradiation

机译:质子辐射期间AlGan双响应传感器闪烁和电气特性的演变

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摘要

Wide bandgap AlGaN is one of the most promising materials for the fabrication of radiation hard, double-response particle detectors for future collider facilities. However, the formation of defects during growth and fabrication of AlGaN-based devices is unavoidable. Furthermore, radiation defects are formed in detector structures during operation at extreme conditions. In this work, study of evolution of the proton-induced luminescence spectra and short-circuit current has been simultaneously performed during 1.6 MeV proton irradiation. GaN and AlGaN (with various Al concentrations) epi-layers grown by metalorganic chemical vapour deposition technique and Schottky diode structures have been examined. Variations of spectral and electrical parameters could be applied for the remote dosimetry of large hadron fluences.
机译:宽带隙AlGaN是用于制造辐射的最有前途的材料之一,用于将来的撞机设施适用于抗辐射,双响应粒子探测器。然而,在生长和制造基于AlGaN的装置的缺陷的形成是不可避免的。此外,在极端条件下操作期间在检测器结构中形成辐射缺陷。在这项工作中,在1.6MeV质子辐射期间同时进行了质子诱导的发光光谱和短路电流的进化。已经研究了GaN和AlGaN(具有各种Al浓度)通过金属化学化学气相沉积技术和肖特基二极管结构种植的齿层。可以应用光谱和电气参数的变化,用于大强子流量的远程剂量测定法。

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