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Novel TEM Specimen Preparation Using Multi-Source Focused Ion Beams for Real-Time Electrostatic Biasing Studies

机译：用于实时静电偏置研究的多源聚焦离子束的新型TEM样本制备

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Joesph A. Peoples; Brandom M. Howe; Lawrence Grazulis; Krishnamurthy Mahalingam;
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年度 2016
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1. 集束イオンビーム法によるTEM 試料作製とダメージ層除去TEM specimen preparation using focused ion beam and removal of the damaged layer [J] . 加藤丈晴, 佐々木宏和, 平山司材料とプロセス: 日本鉄鋼協会講演論文集 . 2009,第1期

机译：使用聚焦离子束制备TEM样品并去除受损层
2. TEM specimen preparation by Au~+, Ga~+, Si~+ and Si~(++) focused ion beams for off-axis electron holography [J] . G. BenAssayag, P. Salles, F. Bertin, Microelectronic Engineering . 2010,第5a8期

机译：用Au〜+，Ga〜+，Si〜+和Si〜（++）聚焦离子束制备TEM标本，用于离轴电子全息
3. Application of focused ion beam lift-out specimen preparation to TEM, SEM, STEM, AES and SIMS analysis [J] . Stevie FA., Giannuzzi LA., Shofner TL., Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films . 2001,第5期

机译：聚焦离子束提升样品制备在TEM，SEM，STEM，AES和SIMS分析中的应用
4. The application of tripod polishing and focused ion beam milling to the TEM specimen preparation of HVOF thermally sprayed coatings [C] . Gaoning Kong, D Graham McCartney, Paul D Brown, Institute of Physics Electron Microscopy and Analysis Group Conference . 2004

机译：三脚架抛光和聚焦离子梁研磨在热喷涂涂层HVOF的TEM样品制备中的应用
5. Computational and experimental quantification of focused ion beam damage in silicon during TEM specimen preparation. [D] . Jamison, Robert Bruce. 2000

机译：TEM样品制备过程中硅中聚焦离子束损伤的计算和实验量化。
6. Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam [O] . Stefano Rubino, Petter Melin, Paul Spellward, 2014

机译：聚焦离子束制备低温电子显微镜样品
7. The application of tripod polishing and focused ion beam milling to the TEM specimen preparation of HVOF thermally sprayed coatings [O] . Kong Gaoning, McCartney D. Graham, Brown Paul D. 2004

机译：三脚架抛光和聚焦离子束铣削在HVOF热喷涂涂层TEM样品制备中的应用

Novel TEM Specimen Preparation Using Multi-Source Focused Ion Beams for Real-Time Electrostatic Biasing Studies

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