An investigation of the fine structure of the Al-K and Ti-K edges in intermetallic compounds using electron microscopy and synchrotron radiation

摘要

The extended fine structures of the aluminium and titanium K-edges of metals and intermetallics of the Ti-Al phase diagram are studied using both X-ray Absorption Spectrometry (XAS) and Electron Energy Loss Spectrometry (EELS). The Extended X-ray Absorption Fine Structure (EXAFS) and Extended Electron Energy Loss Fine Structure (EXEELFS) in TiAl due to the first coordination shell are isolated and quantified using the standard method. For more accuracy, the phase and amplitude of backscattering are derived from the experimental measurements in pure metals (Al, Ti) and line compounds (Al3Ti, Ti3Al). Results from EXAFS and EXEELFS are in very good agreement. The analyzed volumes can be up to 107 time smaller with electrons, allowing the study of precipitates.