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High-temperature deep-level transient spectroscopy system for defect studies in wide-bandgap semiconductors

机译：宽带隙半导体缺陷研究的高温深型瞬态光谱系统

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S. Majdi; M. Gabrysch; N. Suntornwipat; F. Burmeister; R. Jonsson; K. K. Kovi; A. Hallén;
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1. Laplace-transform deep-level spectroscopy: The technique and its applications to the study of point defects in semiconductors [J] . Dobaczewski L, Peaker AR, Nielsen KB Journal of Applied Physics . 2004,第9期

机译：拉普拉斯变换深层光谱：该技术及其在半导体中的点缺陷研究
2. The study of low temperature irradiation induced defects in p-Si using deep-level transient spectroscopy [J] . Danga H. T., Tunhuma S. M., Auret F. D., Nuclear Instruments & Methods in Physics Research. B, Beam Interactions with Materials and Atoms . 2019,第MARa1期

机译：用深层瞬态光谱研究p-Si中低温辐照引起的缺陷
3. Study of Extended Electrically Active Defects in Heterostructures Based on (Ga,Mn)As/(In,Ga)As by Electron Beam-Induced Current and Deep-Level Transient Spectroscopy [J] . O. A. Soltanovich, V. A. Kovalskiy, P. S. Vergeles, Journal of surface investigation: x-ray, synchrotron and neutron techniques . 2019,第1期

机译：基于（Ga，Mn）的异质结构在电子束诱导的电流和深型瞬态扫描基于/（族，Ga）的异质缺陷的研究
4. A study of the dependence of electron-induced defects on the doping impurity density in n-type germanium by deep-level transient spectroscopy (DLTS) [C] . Cloud Nyamhere, F.D. Auret, A.G.M. Das, International Conference on Defects in Semiconductors; 20070722-27; Albuquerque,NM(US) . 2007

机译：深层瞬态光谱法研究电子诱导缺陷对n型锗掺杂杂质密度的依赖性
5. Deep-level transient spectroscopy (DLTS) for the determination of trap parameters in semiconductor devices [D] . Kuang, Li-chao 1997

机译：用于确定半导体器件中陷阱参数的深层瞬态光谱法（DLTS）
6. Transient Exposure to Ethanol during Zebrafish Embryogenesis Results in Defects in Neuronal Differentiation: An Alternative Model System to Study FASD [O] . Xavier Joya, Oscar Garcia-Algar, Oriol Vall, -1

机译：斑马鱼胚胎发生过程中短暂暴露于乙醇会导致神经元分化缺陷：研究FASD的替代模型系统
7. Junction spectroscopy techniques and deep-level defects in semiconductors [O] . Peaker, Anthony, Markevich, Vladimir, Coutinho, J. 2027

机译：结光谱技术和半导体中的深层缺陷
8. Deep-Level Transient Spectroscopy Studies of Defects in GaAs-AlGaAs Superlattices [R] . Martin, P. A., Hess, K., Emanuel, M., 1986

机译：Gaas-alGaas超晶格中缺陷的深能级瞬态光谱研究

High-temperature deep-level transient spectroscopy system for defect studies in wide-bandgap semiconductors

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