首页> 外文OA文献 >Carbon defects as sources of the green and yellow luminescence bands in undoped GaN
【2h】

Carbon defects as sources of the green and yellow luminescence bands in undoped GaN

机译:作为未掺杂的GaN中的绿色和黄色发光带的碳缺陷

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

In high-purity GaN grown by hydride vapor phase epitaxy, the commonly observed yellow luminescence (YL) band gives way to a green luminescence (GL) band at high excitation intensity. We propose that the GL band with a maximum at 2.4 eV is caused by transitions of electrons from the conduction band to the 0/+ level of the isolated CN defect. The YL band, related to transitions via the −/0 level of the same defect, has a maximum at 2.1 eV and can be observed only for some high-purity samples. However, in less pure GaN samples, where no GL band is observed, another YL band with a maximum at 2.2 eV dominates the photoluminescence spectrum. The latter is attributed to the CNON complex.
机译:在通过氢化物气相外延生长的高纯度GaN中,通常观察到的黄色发光(YL)带在高激发强度下被绿色发光(GL)带所取代。我们建议最大带隙为2.4 eV的GL带是由电子从导带到隔离的CN缺陷的0 / +能级的跃迁引起的。与通过同一缺陷的-/ 0级跃迁相关的YL带在2.1 eV处具有最大值,仅在某些高纯度样品中可以观察到。但是,在纯度较差的GaN样品中,没有观察到GL谱带,而另一个在2.2 eV处最大的YL谱带主导了光致发光光谱。后者归因于CNON复合体。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号