Local bonding configurations of amorphous SexTe1−x films

摘要

X-ray absorption measurements at both the Se and Te K-edges have been performed in binary chalcogenide amorphous (a-) SexTe1-x films. The EXAFS results for the Se K-edge indicate that the number of Se-Se bonds decreases with increasing Te content, while the number of Se-Te bonds increases. However, the bonding configuration of the Te site, which consists of one Se-Te and one Te-Te bond, remains the same as a function of composition. Furthermore, contrary to several other reports, we find no evidence of two other inequivalent Te sites (i.e., Te bonded to two Se neighbors or bonded to two Te neighbors).