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Understanding GaAs Native Oxides By Correlating Three Liquid Contact Angle Analysis (3LCAA) and High Resolution Ion Beam Analysis (HR-IBA) to X-Ray Photoelectron Spectroscopy (XPS) as Function of Surface Processing — Erratum

机译：通过将三个液体接触角分析（3LCAA）和高分辨率离子束分析（HR-IBA）与X射线光电子谱（XPS）相关，以表面处理的功能来了解GaAs本地氧化物 - 错误

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Sukesh Ram; Amber A. Chow; Shaurya Khanna; Nikhil C. Suresh; Franscesca J. Ark; Saaketh R. Narayan; Aashi R. Gurijala; Jack M. Day; Timothy Karcher; Robert J. Culbertson; Shawn D. Whaley; Karen L. Kavanagh; Nicole Herbots;
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Understanding GaAs Native Oxides By Correlating Three Liquid Contact Angle Analysis (3LCAA) and High Resolution Ion Beam Analysis (HR-IBA) to X-Ray Photoelectron Spectroscopy (XPS) as Function of Surface Processing — Erratum

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