Estudio comparativo de técnicas de preparación de muestraspara microscopía electrónica de transmisión de recubrimientos cerámicos proyectados por plasma

摘要

The development of advanced materials, with complex microstructures, is a permanent challenge to the development and application of new efficient techniques for microstructural characterization. In ceramic coatings on metals, there exist a differential ion-milling ratio between both components, limiting in principle the use of conventional techniques. In this work, we report on a comparative study of TEM sample preparation techniques for plasma-sprayed ceramic coatings. Firstly, we have used a procedure derived from the conventional one (polishing, dimpling, ion milling), and alternatively a new technique using focused ion-beam milling. The material selected for this study is fine-grained alumina that was plasma-sprayed on a steel substrate. The efficiency of both techniques is discussed along with the most significant microstructural features of the material subject of study.