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Aperture-scanning Fourier ptychography for 3D refocusing and super-resolution macroscopic imaging

机译:用于3D重新聚焦和超分辨率宏观成像的孔径扫描傅里叶刻印术

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摘要

We report an imaging scheme, termed aperture-scanning Fourier ptychography, for 3D refocusing and super-resolution macroscopic imaging. The reported scheme scans an aperture at the Fourier plane of an optical system and acquires the corresponding intensity images of the object. The acquired images are then synthesized in the frequency domain to recover a high-resolution complex sample wavefront; no phase information is needed in the recovery process. We demonstrate two applications of the reported scheme. In the first example, we use an aperture-scanning Fourier ptychography platform to recover the complex hologram of extended objects. The recovered hologram is then digitally propagated into different planes along the optical axis to examine the 3D structure of the object. We also demonstrate a reconstruction resolution better than the detector pixel limit (i.e., pixel super-resolution). In the second example, we develop a camera-scanning Fourier ptychography platform for super-resolution macroscopic imaging. By simply scanning the camera over different positions, we bypass the diffraction limit of the photographic lens and recover a super-resolution image of an object placed at the far field. This platform’s maximum achievable resolution is ultimately determined by the camera’s traveling range, not the aperture size of the lens. The FP scheme reported in this work may find applications in 3D object tracking, synthetic aperture imaging, remote sensing, and optical/electron/X-ray microscopy.
机译:我们报告了一种称为3D重聚焦和超分辨率宏观成像的成像方案,称为孔径扫描傅里叶刻印术。报告的方案扫描光学系统的傅立叶平面上的光圈,并获取物体的相应强度图像。然后在频域中合成获取的图像,以恢复高分辨率的复杂样本波前;恢复过程中不需要阶段信息。我们演示了该报告方案的两个应用。在第一个示例中,我们使用孔径扫描傅立叶指纹图谱平台恢复扩展对象的复杂全息图。然后将恢复的全息图沿光轴数字传播到不同平面中,以检查物体的3D结构。我们还展示了优于探测器像素极限的重建分辨率(即像素超分辨率)。在第二个示例中,我们开发了一种用于超分辨率宏观成像的相机扫描傅里叶指纹图谱平台。通过简单地在不同位置扫描相机,我们绕过了摄影镜头的衍射极限,并恢复了放置在远场的物体的超分辨率图像。该平台可达到的最大分辨率最终取决于相机的行程范围,而不是镜头的光圈大小。在这项工作中报告的FP方案可能会在3D对象跟踪,合成孔径成像,遥感以及光学/电子/ X射线显微镜中找到应用。

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