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Analysis of Point Defects in Graphene Using Low Dose Scanning Transmission Electron Microscopy Imaging and Maximum Likelihood Reconstruction (Phys. Status Solidi B 11/2017)

机译：利用低剂量扫描透射电子显微镜成像和最大似然重构的石墨烯点缺陷分析（Phys。Status Solidi B 11/2017）

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Christian Kramberger; Andreas Mittelberger; Christoph Hofer; Jannik C. Meyer;
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1. Analysis of Point Defects in Graphene Using Low Dose Scanning Transmission Electron Microscopy Imaging and Maximum Likelihood Reconstruction (Phys. Status Solidi B 11/2017) [J] . Kramberger Christian, Mittelberger Andreas, Hofer Christoph, Physica status solidi, B. Basic research . 2017,第11期

机译：利用低剂量扫描透射电子显微镜成像和最大似然重构的石墨烯点缺陷分析（Phys。Status Solidi B 11/2017）
2. Analysis of Point Defects in Graphene Using Low Dose Scanning Transmission Electron Microscopy Imaging and Maximum Likelihood Reconstruction [J] . Kramberger Christian, Mittelberger Andreas, Hofer Christoph, Physica status solidi, B. Basic research . 2017,第11期

机译：利用低剂量扫描透射电子显微镜成像和最大似然重建石墨烯点缺陷分析
3. APS -APS March Meeting 2017 - Event - Image Reconstruction for Low Dose Scanning Electron Microscopy. [J] . Petru Fodor, Alina Lazar Bulletin of the American Physical Society . 2017,第4期

机译：APS -APS 2017年3月会议-事件-低剂量扫描电子显微镜的图像重建。
4. Sparsity based noise removal from low dose scanning electron microscopy images [C] . A. Lazar, P.S. Fodor Computational imaging XIII . 2015

机译：低剂量扫描电子显微镜图像中基于稀疏性的噪声消除
5. Microstructural analysis of YBa2Cu3O7-x superconductor and low-dose scanning transmission electron microscopy. [D] . Hwang, Sunghwan. 2015

机译：YBa2Cu3O7-x超导体的微结构分析和小剂量扫描透射电子显微镜。
6. Ab initio maximum likelihood reconstruction from cryo electron microscopy images of an infectious virion of the tailed bacteriophage P22 and maximum likelihood versions of Fourier Shell Correlation appropriate for measuring resolution of spherical or cylindrical objects [O] . Cory J. Prust, Peter C. Doerschuk, Gabriel C. Lander, -1

机译：AB Initio来自Cryo电子显微镜图像的最大似然重建尾噬菌体P22的传染病患者和傅立叶壳相关的最大似然版本适合测量球形或圆柱形物体的分辨率
7. Back Cover: Low energy scanning transmission electron beam induced current for nanoscale characterization of p-n junctions (Phys. Status Solidi RRL 1/2017) [O] . Patrick Peretzki, Benedikt Ifland, Christian Jooss, 2017

机译：后盖：低能量扫描透射电子束诱导P-N结纳米级表征的电流（PHY。Status Solidi RRL 1/2017）
8. Direct imaging of the atomic structure and chemistry of defects and interfaces by Z-contrast STEM (scanning transmission electron microscopy). [R] . Pennycook, S. J., Chisholm, M. F., Jesson, D. E., 1990

机译：通过Z对比sTEm（扫描透射电子显微镜）直接成像原子结构和缺陷和界面的化学。

Analysis of Point Defects in Graphene Using Low Dose Scanning Transmission Electron Microscopy Imaging and Maximum Likelihood Reconstruction (Phys. Status Solidi B 11/2017)

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