A quasi-optical power density meter for millimeter and submillimeter wavelengths has been developed. The device is a 2-cm^2 thin-film bismuth bolometer deposited on a mylar membrane. The resistance responsivity is 150 Ω/W, and the time constant is 1 min. The meter is calibrated at DC. The bolometer is much thinner than a wavelength, and can thus be modeled as a lumped resistance in a transmission-line equivalent circuit. The absorption coefficient is 0.5 for 189-Ω/square film. The power-density meter has been used to measure absolute power densities for millimeter-wave antenna efficiency measurements. Absolute power densities of 0.5 mW/cm^2 have been measured to an estimated accuracy of 5%.
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机译：已经开发出一种用于毫米和亚毫米波长的准光功率密度计。该设备是沉积在聚酯薄膜上的2 cm ^ 2薄膜铋测辐射热仪。电阻响应率为150Ω/ W，时间常数为1分钟。仪表已在DC处校准。辐射热计比波长薄得多，因此可以建模为传输线等效电路中的集总电阻。 189-Ω/平方薄膜的吸收系数为0.5。功率密度计已用于测量绝对功率密度，用于毫米波天线效率测量。已测量出0.5 mW / cm ^ 2的绝对功率密度，估计精度为5％。
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