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Low-Complexity Codes for Random and Clustered High-Order Failures in Storage Arrays

机译:存储阵列中随机和群集高阶故障的低复杂度代码

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摘要

RC (Random/Clustered) codes are a new efficient array-code family for recovering from 4-erasures. RC codes correct most 4-erasures, and essentially all 4-erasures that are clustered. Clustered erasures are introduced as a new erasure model for storage arrays. This model draws its motivation from correlated device failures, that are caused by physical proximity of devices, or by age proximity of endurance-limited solid-state drives. The reliability of storage arrays that employ RC codes is analyzed and compared to known codes. The new RC code is significantly more efficient, in all practical implementation factors, than the best known 4-erasure correcting MDS code. These factors include: small-write update-complexity, full-device update-complexity, decoding complexity and number of supported devices in the array.
机译:RC(随机/群集)代码是一种新的高效阵列代码系列,可从4擦除中恢复。 RC代码纠正了大多数4擦除,并且基本上纠正了所有聚集的4擦除。引入了群集擦除作为存储阵列的新擦除模型。该模型的动力来自于相关的设备故障,这些故障是由设备的物理接近性或耐久性受限制的固态驱动器的老化程度引起的。分析使用RC代码的存储阵列的可靠性,并将其与已知代码进行比较。在所有实际的实现因素中,新的RC代码比最著名的4纠错MDS代码效率更高。这些因素包括:小写更新复杂度,全设备更新复杂度,解码复杂度和阵列中支持的设备数量。

著录项

  • 作者

    Cassuto Yuval; Bruck Jehoshua;

  • 作者单位
  • 年度 2009
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  • 原文格式 PDF
  • 正文语种 {"code":"en","name":"English","id":9}
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