Contact-limited currents in metal-insulator-metal structures

摘要

The physical mechanisms underlying current flow in solid-state MIM structures are reviewed with emphasis on criteria for determining the dominant conduction mechanism in a given experimental situation. Measurements of the bias and temperature dependence of currents through structures incorporating a thin film of single-crystal gallium selenide are reported, and are shown to be in excellent agreement with the predictions of a simple physical model of contact-limited emission. Independently measured properties of bulk single-crystal gallium selenide are used in all calculations; no adjustable parameters are employed. We believe that this study presents unequivocal evidence for contact-limited thermionic currents in solid-state MIM structures.