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Breaking resolution limits in ultrafast electron diffraction and microscopy

机译:超快电子衍射和显微镜技术突破了分辨率极限

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摘要

Ultrafast electron microscopy and diffraction are powerful techniques for the study of the time-resolved structures of molecules, materials, and biological systems. Central to these approaches is the use of ultrafast coherent electron packets. The electron pulses typically have an energy of 30 keV for diffraction and 100–200 keV for microscopy, corresponding to speeds of 33–70% of the speed of light. Although the spatial resolution can reach the atomic scale, the temporal resolution is limited by the pulse width and by the difference in group velocities of electrons and the light used to initiate the dynamical change. In this contribution, we introduce the concept of tilted optical pulses into diffraction and imaging techniques and demonstrate the methodology experimentally. These advances allow us to reach limits of time resolution down to regimes of a few femtoseconds and, possibly, attoseconds. With tilted pulses, every part of the sample is excited at precisely the same time as when the electrons arrive at the specimen. Here, this approach is demonstrated for the most unfavorable case of ultrafast crystallography. We also present a method for measuring the duration of electron packets by autocorrelating electron pulses in free space and without streaking, and we discuss the potential of tilting the electron pulses themselves for applications in domains involving nuclear and electron motions.
机译:超快电子显微镜和衍射是研究分子,材料和生物系统的时间分辨结构的强大技术。这些方法的核心是超快速相干电子包的使用。电子脉冲的衍射能量通常为30 keV,显微镜检查的能量为100–200 keV,相当于光速的33–70%。尽管空间分辨率可以达到原子级,但时间分辨率受脉冲宽度,电子和用于引发动态变化的光的群速度差的限制。在这项贡献中,我们将倾斜的光脉冲的概念引入衍射和成像技术,并通过实验证明了该方法。这些进步使我们能够将时间分辨率的极限降低到几飞秒甚至可能几阿秒的范围。利用倾斜的脉冲,样品的每个部分都在电子到达样品时的同一时间被激发。在这里,这种方法在超快晶体学的最不利情况下得到了证明。我们还提出了一种通过自相关自由空间中的电子脉冲而不会产生条纹的方法来测量电子包的持续时间的方法,并且我们讨论了倾斜电子脉冲本身的潜力,可用于涉及核运动和电子运动的领域。

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  • 作者

    Baum Peter; Zewail Ahmed H.;

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  • 年度 2006
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  • 原文格式 PDF
  • 正文语种 {"code":"en","name":"English","id":9}
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