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The Effect of Zirconium Doping on Solution-Processed Indium Oxide Thin Films Measured by a Novel Nondestructive Testing Method (Microwave Photoconductivity Decay)

机译：锆掺杂对通过新型非破坏性检测方法测量的溶液加工氧化铟薄膜的影响（微波光电导衰减）

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Jingying Zhang; Xiao Fu; Shangxiong Zhou; Honglong Ning; Yiping Wang; Dong Guo; Wei Cai; Zhihao Liang; Rihui Yao; Junbiao Peng;
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1. Boron-Doped Peroxo-Zirconium Oxide Dielectric for High-Performance, Low-Temperature, Solution-Processed Indium Oxide Thin-Film Transistor [J] . Jee Ho Park, Young Bum Yoo, Keun Ho Lee ACS applied materials & interfaces . 2013,第16期

机译：高性能，低温，固溶处理的氧化铟薄膜晶体管的硼掺杂过氧锆氧化物电介质
2. Boron-Doped Peroxo-Zirconium Oxide Dielectric for High-Performance, Low-Temperature, Solution-Processed Indium Oxide Thin-Film Transistor [J] . Jee Ho Park, Young Bum Yoo, Keun Ho Lee ACS applied materials & interfaces . 2013,第16期

机译：高性能，低温，固溶处理的氧化铟薄膜晶体管的硼掺杂过氧锆氧化物电介质
3. Solution-processed indium-zinc-oxide thin-film transistors based on anodized aluminum oxide gate insulator modified with zirconium oxide [J] . Li Yuzhi, Lan Linfeng, Xiao Peng, RSC Advances . 2015,第63期

机译：基于氧化锆的阳极氧化铝栅极绝缘体改性溶液加工的铟 - 氧化锌薄膜晶体管
4. Zirconium-doped indium oxide thin films for organic light-emitting diodes [C] . H.Kim, J.S.Horwitz, G.P.Kushto, Conference on organic light-emitting materials and devices . 2001

机译：用于有机发光二极管的锆掺杂氧化物薄膜
5. Composition Engineering for Solution-Processed Gallium-Rich Indium-Gallium-Zinc-Oxide Thin Film Transistors [D] . Wang, Isaac Caleb. 2018

机译：溶液处理富镓铟镓锌氧化物薄膜晶体管的组成工程
6. Low-Concentration Indium Doping in Solution-Processed Zinc Oxide Films for Thin-Film Transistors [O] . Xue Zhang, Hyeonju Lee, Jung-Hyok Kwon, 2017

机译：薄膜晶体管溶液处理氧化锌薄膜中的低浓度铟掺杂
7. Low-Concentration Indium Doping in Solution-Processed Zinc Oxide Films for Thin-Film Transistors [O] . Xue Zhang, Hyeonju Lee, Jung-Hyok Kwon, 2017

机译：用于薄膜晶体管的溶液处理氧化锌薄膜中的低浓度铟掺杂

The Effect of Zirconium Doping on Solution-Processed Indium Oxide Thin Films Measured by a Novel Nondestructive Testing Method (Microwave Photoconductivity Decay)

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