首页> 外文OA文献 >Comment on “Effects of focused ion beam milling on the nanomechanical behavior of a molybdenum-alloy single crystal” Appl. Phys. Lett. 91, 111915 (2007)
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Comment on “Effects of focused ion beam milling on the nanomechanical behavior of a molybdenum-alloy single crystal” Appl. Phys. Lett. 91, 111915 (2007)

机译:评论“聚焦离子束铣削对钼合金单晶纳米力学行为的影响”。物理来吧91,111915(2007)

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摘要

While this article provides insight into differences in mechanics between Ga+-irradiated and “pure” surfaces of molybdenum, there are several statements that are either inaccurate or poorly stated. It is clear that when a surface is directly irradiated by orthogonal ion beam (0.07–0.21 mW), a focused ion beam (FIB) damage layer will likely form and affect the strength. However, this finding does not provide adequate foundation for raising the question of FIB-induced hardening in nanopillars, given the vast differences between these experiments and procedure used in pillar fabrication. These issues would cause considerable confusion and result in disservice to mechanical testing community if not clarified.
机译:尽管本文提供了对Ga +辐照和“纯”钼表面之间的力学差异的深刻见解,但仍有一些陈述不准确或陈述不充分。显然,当正交离子束(0.07–0.21 mW)直接照射表面时,聚焦离子束(FIB)损坏层可能会形成并影响强度。但是,鉴于这些实验与柱制造中使用的程序之间的巨大差异,这一发现不能为提出FIB诱导的纳米柱硬化问题提供充分的基础。这些问题会引起相当大的混乱,如果不加以澄清,将导致对机械测试界的损害。

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