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High-Accuracy Correction of a Microlens Array for Plenoptic Imaging Sensors

机译:用于全光成像传感器的微透镜阵列的高精度校正

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摘要

Microlens array (MLA) errors in plenoptic cameras can cause the confusion or mismatching of 4D spatio-angular information in the image space, significantly affecting the accuracy and efficiency of target reconstruction. In this paper, we present a high-accuracy correction method for light fields distorted by MLA errors. Subpixel feature points are extracted from the microlens subimages of a raw image to obtain correction matrices and perform registration of the corresponding subimages at a subpixel level. The proposed method is applied for correcting MLA errors of two different categories in light-field images, namely form errors and orientation errors. Experimental results show that the proposed method can rectify the geometric and intensity distortions of raw images accurately and improve the quality of light-field refocusing. Qualitative and quantitative comparisons between images before and after correction verify the performance of our method in terms of accuracy, stability, and adaptability.
机译:金属光电摄像机中的微透镜阵列(MLA)误差可能导致图像空间中的4D时空信息的混淆或不匹配,显着影响目标重建的准确性和效率。在本文中,我们提出了一种高精度校正方法,用于由MLA误差扭曲的光场。 Subpixel特征点从RAW图像的微透镜子图像中提取,以获得校正矩阵并在子像素级别执行相应的子图像的登记。所提出的方法用于校正光场图像中的两个不同类别的MLA误差,即形成误差和方向误差。实验结果表明,该方法可以准确地纠正原料图像的几何和强度畸变,提高光场重新剖足的质量。在校正之前和之后的图像之间的定性和定量比较验证了在精度,稳定性和适应性方面的方法的性能。

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