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Dimensional and structural stability of gamma irradiatedudstacked die quad flat no leads (QFN)

机译:γ辐照 ud的尺寸和结构稳定性堆叠裸片四方扁平无引线(QFN)

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摘要

The physical properties and structural stability of the Quad Flat No-Leads (QFN) package with different gamma radiation doses have been investigated. The packages were irradiated with Co-60 gamma radiation with varying doses of 5 Gy, 50 Gy, 500 Gy, 5 kGy and 50 kGy with operating dose of 2.54 kGy/h at room temperature. The infinite focus microscope (IFM) was used to measure the dimensional change and slanting/warpage behaviour, while the 3D CT Scan X-ray machine was used to determine the occurrence of deflection on a wire in package due to exposure. It is believed that radiation effect on ceramic filler in the epoxy mold compound (EMC) plays an important role to induce the defects and resulted in swelling of the package. The slanting/warpage behaviour is believed to be caused by the swelling behaviour of ceramic filler and further induced structural stability. The induced stress on the EMC structural after the dimensional change and slanting/warpage failure leads to the occurrence of wire sweep. The finding suggests that defect production in swelled ceramic filler leads to the occurrence of dimensional and structure instability.
机译:研究了具有不同伽马辐射剂量的方形扁平无铅(QFN)封装的物理性能和结构稳定性。在室温下,以5 Gy,50 Gy,500 Gy,5 kGy和50 kGy的不同剂量的Co-60γ射线对包装进行辐照,工作剂量为2.54 kGy / h。无限聚焦显微镜(IFM)用于测量尺寸变化和倾斜/翘曲行为,而3D CT扫描X射线机用于确定包装中由于暴露而导致的导线变形。据信,对环氧模塑化合物(EMC)中的陶瓷填料的辐射效应在诱发缺陷和导致包装膨胀方面起着重要作用。认为倾斜/翘曲行为是由陶瓷填料的溶胀行为和进一步引起的结构稳定性引起的。尺寸变化和倾斜/翘曲破坏后,EMC结构上产生的应力导致线扫的发生。该发现表明溶胀的陶瓷填料中的缺陷产生导致尺寸和结构不稳定性的发生。

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