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Time-resolved photoluminescence for evaluating laser-induced damage during dielectric stack ablation in silicon solar cells

机译：在硅太阳能电池中的介电堆叠消融期间评估激光诱导损伤的时间分辨光致发光

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Stéphanie Parola; Danièle Blanc-Pélissier; Corina Barbos; Marine Le Coz; Gilles Poulain; Mustapha Lemiti;
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1. Time-resolved photoluminescence for evaluating laser-induced damage during dielectric stack ablation in silicon solar cells [J] . Parola Stephanie, Blanc-Pelissier Daniele, Barbos Corina, Applied Surface Science . 2016,第Juna30期

机译：时间分辨光致发光，用于评估硅太阳能电池中电介质堆叠烧蚀过程中的激光诱导损伤
2. Characterization of laser-induced damage in silicon solar cells during selective ablation processes [J] . G.Poulain, D.Blanc, A. Focsa, Materials Science and Engineering . 2013,第9期

机译：选择性烧蚀过程中硅太阳能电池中激光诱导的损伤的表征
3. Reduction of picosecond laser ablation threshold and damage via nanosecond pre-pulse for removal of dielectric layers on silicon solar cells [J] . A. A. Brand, F. Meyer, J.-F. Nekarda, Applied Physics . 2014,第1期

机译：降低皮秒激光烧蚀阈值，并通过纳秒级预脉冲降低损伤，以去除硅太阳能电池上的介电层
4. GENTLE AND DAMAGE FREE ABLATION OF DIELECTRIC LAYERS USING A FEMTOSECOND LASER SOURCE FOR HIGH EFFICIENCY SILICON WAFER SOLAR CELLS [C] . Jaffar Moidcen Yacob Ali, Vinodh Shanmugam, Armin G. Aberle, European Photovoltaic Solar Energy Conference and Exhibition . 2019

机译：使用用于高效硅晶片太阳能电池的飞秒激光源温和和损坏介电层的自由烧蚀
5. Defect diagnostics using scanning photoluminescence in multicrystalline silicon for solar cells. [D] . Tarasov, Igor. 2002

机译：在太阳能电池的多晶硅中使用扫描光致发光进行缺陷诊断。
6. Direct evaluation of influence of electron damage on the subcell performance in triple-junction solar cells using photoluminescence decays [O] . David M. Tex, Tetsuya Nakamura, Mitsuru Imaizumi, -1

机译：使用光致发光衰减直接评估电子损伤对三结太阳能电池中子电池性能的影响
7. Investigation of dielectric layers laser ablation mechanism on n-PERT silicon solar cells for (Ni) plating process: Laser impact on surface morphology, composition, electrical properties and metallization quality [O] . Cécile Molto, Jung Eun Lee, Jan Nekarda, 2019

机译：N-Pert硅太阳能电池介电层激光烧蚀机理的研究（NI）电镀工艺：激光撞击表面形态，组成，电学性能和金属化质量

Time-resolved photoluminescence for evaluating laser-induced damage during dielectric stack ablation in silicon solar cells

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