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Optical approach to thermopower and conductivity measurements in thin‐film semiconductors

机译：薄膜半导体热电机和电导率测量的光学方法

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Helmut Dersch; Nabil M. Amer;
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年度 1984
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1. Determination of model-free Kramers-Kronig consistent optical constants of thin absorbing films from just one spectral measurement: Application to organic semiconductors [J] . Robert Nitsche, Torsten Fritz Physical review. B, Condensed Matter And Materials Physics . 2004,第19期

机译：仅通过一次光谱测量即可确定无模型的吸收膜的Kramers-Kronig一致光学常数：在有机半导体中的应用
2. Enhanced Photoconductivity in Thin-Film Semiconductors Optically Coupled to Photonic Crystals [J] . Paul G. OBrien, Nazir P. Kherani, Stefan Zukotynski, Advanced Materials . 2007,第23期

机译：光耦合到光子晶体的薄膜半导体中增强的光电导性
3. The Effect of Optical Radiation on the Semiconductor Conductivity in a Thin-Film Ferroelectric-Semiconductor Structure [J] . V. P. Afanasev, D. Yu. Bulat, E. Yu. Kaptelov, Technical physics letters: Letters to the Russian journal of applied physics . 2004,第6期

机译：薄膜铁电半导体结构中光辐射对半导体电导率的影响
4. ESTIMATING DENSITY REDUCTION AND PHONON LOCALIZATION FROM OPTICAL THERMAL CONDUCTIVITY MEASUREMENTS OF POROUS SILICA AND AEROGEL THIN FILMS [C] . Patrick E. Hopkins, Bryan J. Kaehr, Darren Dunphy, ASME/JSME thermal engineering joint conference;AJTEC2011 . 2012

机译：从多孔二氧化硅和气凝胶薄膜的光学热导率测量估算密度降低和声子定位
5. Studies of the thermal conductivity of thin films by optical pump and probe measurements and molecular dynamics simulations. [D] . Daly, Brian Christopher. 2003

机译：通过光学泵浦和探针测量以及分子动力学模拟研究薄膜的导热性。
6. Bulk and surface recombination properties in thin film semiconductors with different surface treatments from time-resolved photoluminescence measurements [O] . Thomas P. Weiss, Benjamin Bissig, Thomas Feurer, -1

机译：时间分辨光致发光测量中具有不同表面处理的薄膜半导体的体相和表面复合特性
7. Studies on Hall Effect and DC Conductivity Measurements of Semiconductor Thin films Prepared by Chemical Bath Deposition (CBD) method [O] . Thirumavalavana S., Mani K., Suresh Sagadevan S. 2015

机译：化学浴沉积（CBD）方法制备的半导体薄膜的霍尔效应和直流电导率测量的研究
8. Studies, Research and Investigations of the Optical Properties of Thin Films of Metals Semiconductors and Dielectrics [R] . Scheddy, C. H. 1964

机译：金属半导体和电介质薄膜光学特性的研究，研究与探讨

Optical approach to thermopower and conductivity measurements in thin‐film semiconductors

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