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Concepts for nondestructive and depth-resolved X-ray residual stress analysis in the near-surface region of nearly single crystalline materials with mosaic structure

机译：具有马赛克结构的近乎单晶材料的近表面区域的非破坏性和深度分辨X射线残余应力分析的概念

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Andreas Hollmann; Matthias Meixner; Manuela Klaus; Christoph Genzel;
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年度 2021
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1. Investigation of complex residual stress states in the near-surface region: Evaluation of the complete stress tensor by X-ray diffraction pattern decomposition [J] . Schoderboeck Peter Applied Surface Science . 2019,第FEBa1期

机译：研究近地表区域的复杂残余应力状态：通过X射线衍射图分解评估完整应力张量
2. ULTRASONIC NONDESTRUCTIVE METHOD FOR STRESS ANALYSIS OF STRUCTURAL MEMBERS AND NEAR-SURFACE LAYERS OF MATERIALS: FOCUS ON UKRAINIAN RESEARCH (REVIEW) [J] . A. N. Guz International Applied Mechanics . 2014,第3期

机译：超声非破坏性方法用于材料结构构件和近表面层的应力分析：聚焦于乌克兰研究（综述）
3. Residual stress analysis in micro- and nano-structured materials by X-ray diffraction [J] . P. Gergaud, P. Goudeau, O. Sicardy International journal of materials & product technology . 2006,第3a4期

机译：通过X射线衍射分析微结构和纳米结构材料中的残余应力
4. Recent advances in the depth-resolved X-ray analysis of residual stresses and stress-free lattice parameters in Ti(C-N)-gradient coatings [C] . T.Duemmer, B.Eigenmann, D.Loehe International conference on computer methods and experimental measurements for surface treatment effects . 1997

机译：Ti（C-N）-Gradients涂层中残余应力和无应力晶格参数的深度分辨X射线分析的最新进展
5. Nondestructive evaluation of near-surface residual stress in shot-peened nickel-base superalloys. [D] . Yu, Feng. 2005

机译：喷丸强化镍基高温合金中近表面残余应力的无损评估。
6. Homogenization and Localization of Ratcheting Behavior of Composite Materials and Structures with the Thermal Residual Stress Effect [O] . Danhui Yang, Zhibo Yang, Zhi Zhai, 2019

机译：具有热残余应力效应的复合材料和结构棘轮行为的均质化和局域化
7. X-ray diffraction microscopy: emerging imaging techniques for nondestructive analysis of crystalline materials from the millimetre down to the nanometre scale [O] . Borbély, András, Kaysser-Pyzalla, Anke R. 2013

机译：X射线衍射显微镜：新兴的成像技术，用于从毫米到纳米级的晶体材料的无损分析
8. Numerics of Measuring Residual Stresses in Near-Surface Layers by Means of X-Ray Diffraction Analysis. Part 1: Constant and Inclined Stress Distribution [R] . Lode, W., Peiter, A. 1983

机译：用X射线衍射分析测量近地层残余应力的数值。第1部分：恒定和倾斜应力分布

Concepts for nondestructive and depth-resolved X-ray residual stress analysis in the near-surface region of nearly single crystalline materials with mosaic structure

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