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Erratum to : Micro-Analytical Method of Submicron Insulation Morphology near the Semiconducting Interface in an XLPE Cable to Evaluate its Dielectric Properties

机译：误诊为：XLPE电缆中半导体界面附近亚微米绝缘形态的微分析方法，以评估其电介质特性

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1. Dielectric breakdown strength affected by the lamellar configuration in XLPE insulation at a semiconducting interface [J] . Okamoto T., Ishida M. IEEE Transactions on Electrical Insulation . 1989,第4期

机译：介电击穿强度受XLPE绝缘层在半导体界面处的层状结构的影响
2. Effect of Degassing Treatment on the Crystalline Morphology of XLPE Insulation Used for 110kV XLPE Cable [J] . Xin Yu, Peng-Fei Gao, Xiang-Yang Peng, Materials science forum . 2016,第期

机译：脱气处理对110kV XLPE电缆交联聚乙烯绝缘结晶形态的影响
3. Role of semiconducting compounds in water treeing of XLPE cable insulation [J] . Boggs S.A., Mashikian M.S. IEEE Electrical Insulation Magazine . 1994,第1期

机译：半导体化合物在交联聚乙烯电缆绝缘的水树中的作用
4. Improvement of polymer morphology at semi-con interface in an XLPE power cable with interfacial diffusion method and dielectric breakdown strength [C] . Hiroshi Suzuki, Tatsuki Okamoto, Katsumi Uchida, 電気電子絶縁材料システムシンポジウム . 1999

机译：具有界面扩散方法和介电击穿强度的XLPE电力电缆中半耦合界面的高分子形态改善
5. Composition Identification, Aging Mechanisms and Nondestructive Aging Indicator of Commercial Filled Cross-Linked Polyethylene (XLPE) Cable Insulation Materials [D] . Liu, Shuaishuai. 2017

机译：商业填充交联聚乙烯（XLPE）电缆绝缘材料的成分识别，老化机理和无损老化指标
6. A study of expected lifetime of XLPE insulation cables working at elevated temperatures by applying accelerated thermal ageing [O] . Abdulsalam S. Alghamdi, Rayan K. Desuqi 2020

机译：通过加速热老化研究在高温下工作的XLPE绝缘电缆的预期寿命
7. Micro-Analytical Method of Submicron Insulation Morphology near the Semiconducting Interface in an XLPE Cable to Evaluate its Dielectric Properties [O] . Masayoshi Ishida, Tatsuki Okamoto, Hiroshi Suzuki, 1992

机译：XLPE电缆中半导体界面附近亚微米绝缘形态的微分析方法，以评估其介电性能
8. Laboratory Tests on the Role of Impurities in Semiconducting Shield Materials on the Degradation of XLPE Cable Insulation. [R] . Groeger, J. H., Mashikian, M. S., Dale, S. 1989

机译：半导体屏蔽材料中杂质对XLpE电缆绝缘降解的实验室试验。

Erratum to : Micro-Analytical Method of Submicron Insulation Morphology near the Semiconducting Interface in an XLPE Cable to Evaluate its Dielectric Properties

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