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Characterization of Metal Oxide Surfaces and Thin Semiconductor Films by Inelastic Electron Tunneling Spectroscopy.

机译：内部电子隧穿光谱法表征金属氧化物表面和薄半导体膜。

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Morihide HIGO; Satsuo KAMATA;
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年度 2002
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1. Aluminum, oxide, and silicon phonons by inelastic electron tunneling spectroscopy on metal-oxide-semiconductor tunnel junctions: Accurate determination and effect of electrical stress [J] . Petit C, Salace G, Vuillaume D Journal of Applied Physics . 2004,第9期

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2. Anthraquinone-2-carboxylic Acid Deposited from Solution onto Native Oxide Surfaces of Al Films Characterized by Inelastic Electron Tunneling Spectroscopy,X-ray Photoelectron Spectroscopy,and Atomic Force Microscopy [J] . Morihide Higo, Takeshi Miake, Masaru Mitsushio, Chemistry Letters . 2006,第1期

机译：溶液中蒽醌-2-羧酸的非弹性电子隧穿光谱，X射线光电子能谱和原子力显微镜表征
3. Metal Oxide Semiconductors: Direct Photopatterning of Solution–Processed Amorphous Indium Zinc Oxide and Zinc Tin Oxide Semiconductors—A Chimie Douce Molecular Precursor Approach to Thin Film Electronic Oxides (Adv. Mater. Interfaces 15/2018) [J] . Sanctis Shawn, Hoffmann Rudolf C., Bruns Michael, Advanced materials interfaces . 2018,第15期

机译：金属氧化物半导体：直接照射溶液加工的无定形铟锌氧化锌和氧化锡半导体 - 一种薄膜茶片电子氧化物的分子前体方法（ADV。母体。接口15/2018）
4. Visualization Using the Scanning Nonlinear Dielectric Microscopy of Electrons and Holes Localized in the Thin Gate Film of Metal-Oxide-Nitride-Oxide-Semiconductor Type Flash Memory [C] . Honda, Koichiro, Cho, . 2006

机译：使用金属-氧化物-氮化物-氧化物-半导体型闪存栅薄膜中电子和空穴的扫描非线性电介质显微镜进行可视化
5. Characterization of thin film semiconductors by scanning probe microscopy and tunneling spectroscopy. [D] . Gichuhi, Anthony. 1999

机译：通过扫描探针显微镜和隧道光谱法表征薄膜半导体。
6. Electronic Structure of Low-Temperature Solution-Processed AmorphousMetal Oxide Semiconductors for Thin-Film Transistor Applications [O] . Josephine Socratous, Kulbinder K Banger, Yana Vaynzof, -1

机译：低温固溶处理的非晶态电子结构薄膜晶体管应用的金属氧化物半导体
7. Anthraquinone-2-carboxylic Acid Deposited from Solution onto Native Oxide Surfaces of Al Films Characterized by Inelastic Electron Tunneling Spectroscopy, X-ray Photoelectron Spectroscopy, and Atomic Force Microscopy [O] . Morihide Higo, Takeshi Miake, Masaru Mitsushio, 2006

机译：蒽醌-2-羧酸从溶液上沉积在α膜的天然氧化物表面上，其特征在于无间落电子隧穿光谱，X射线光电子体光谱和原子力显微镜
8. Electrochromism in Some Thin-Film Transition-Metal Oxides Characterized by X-Ray Electron Spectroscopy. [R] . Colton, R. J., Guzman, A. M., Rabalais, J. W. 1977

机译：一些薄膜过渡金属氧化物的电致变色特征X射线电子能谱。

Characterization of Metal Oxide Surfaces and Thin Semiconductor Films by Inelastic Electron Tunneling Spectroscopy.

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