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High Resolution X-ray Diffraction Analysis of Defect Density of Gallium Nitride Epitaxial Layer

机译：氮化镓外延层缺陷密度的高分辨率X射线衍射分析

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CUI Ying-Xin; XU Ming-Sheng; XU Xian-Gang; HU Xiao-Bo;
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年度 2015
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High Resolution X-ray Diffraction Analysis of Defect Density of Gallium Nitride Epitaxial Layer

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