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Al-doped MgB2 materials studied using electron paramagnetic resonance and Raman spectroscopy

机译:使用电子顺磁共振和拉曼光谱研究研究的Al掺杂的MGB2材料

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摘要

Undoped and aluminum (Al) doped magnesium diboride (MgB2) samples were synthesized using a high-temperature solid-state synthesis method. The microscopic defect structures of Al-doped MgB2 samples were systematically investigated using X-ray powder diffraction, Raman spectroscopy, and electron paramagnetic resonance. It was found that Mg-vacancies are responsible for defect-induced peculiarities in MgB2. Above a certain level of Al doping, enhanced conductive properties of MgB2 disappear due to filling of vacancies or trapping of Al in Mg-related vacancy sites. Published by AIP Publishing.
机译:使用高温固态合成方法合成未掺杂和铝(Al)掺杂的二硼化镁(MgB2)样品。使用X射线粉末衍射,拉曼光谱和电子顺磁共振来系统地研究了Al掺杂MGB2样品的微观缺陷结构。发现MG职位空缺负责MGB2中的缺陷诱导的特性。在一定水平的Al掺杂,由于填充空位或捕获的MG相关空位位点,因此MGB2的增强的导电性能消失。通过AIP发布发布。

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