首页> 外文OA文献 >Device modelling and model verification for the Euclid CCD273 detector
【2h】

Device modelling and model verification for the Euclid CCD273 detector

机译:EuclID CCD273检测器的设备建模与模型验证

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

Euclid is one of the M-class missions selected for the next phase of ESA’s long-term Cosmic Vision programme. The primary goal of this mission is to observe the distribution and shapes of distant galaxies, with the aim of mapping and characterising the dark energy which makes up about 70% of the universe. This will be achieved by measuring the effects of weak lensing on the captured images, in terms of the distortion caused to the elipticity of galaxy shapes [1]. The e2v CCD273 was designed for the Euclid mission and is adapted from an older design (the CCD203) with changes made to improve CTE under irradiation by solar protons. Reducing the effects of radiation damage in the image sensor will result in images which have minimal distortion. This paper is focused on the on-going development and verification of 3D device models and their integration with Monte Carlo radiation damage models. Parameters such as charge interaction volume versus signal size, pixel full well capacity, and charge transfer behaviour for both the parallel and serial registers will be discussed. The main mission goals are aimed at measuring distortion due to weak lensing, so it is important to differentiate this from distortion due to radiation damage. This work will eventually lead to a method of post processing images to remove the effects of radiation damage.
机译:欧几里得(Euclid)是ESA长期宇宙视野计划下一阶段中选定的M级任务之一。该任务的主要目的是观察遥远星系的分布和形状,以绘制和表征构成宇宙约70%的暗能量。这将通过测量弱镜头对所拍摄图像的影响来实现,就影响星系形状椭圆率的畸变而言[1]。 e2v CCD273是为Euclid任务而设计的,它是从较旧的设计(CCD203)改编而成,并进行了更改以提高在太阳质子照射下的CTE。减少图像传感器中辐射损坏的影响将使图像失真最小。本文着重于3D设备模型的持续开发和验证以及它们与Monte Carlo辐射损伤模型的集成。将讨论诸如电荷相互作用体积与信号大小,像素全阱容量以及并行和串行寄存器的电荷转移行为之类的参数。主要任务目标是测量由于弱透镜造成的畸变,因此将其与由于辐射损坏而引起的畸变区分开是很重要的。这项工作最终将导致一种后处理图像的方法,以消除辐射损伤的影响。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号