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Boosting detection sensitivity by using a surface-wave-enabled darkfield aperture (SWEDA)

机译:通过使用一种能够的暗田光圈(SWEDA)来提高检测灵敏度

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摘要

The on-chip detection of a weak optical signal in biological experiments can easily be complicated by the presence of an overwhelming background signal, and as such, pre-detection background suppression is substantively important for weak signal detection. In this paper, we report a structure that can be directly incorporated onto optical sensors to accomplish background suppression prior to detection. This structure, termed surface-wave-enabled darkfield aperture (SWEDA), consists of a central sub-wavelength hole surrounded by concentric grooves that are milled onto a gold layer. Incoming light can be collected and converted into surface waves (SW) by the concentric grooves and then be recoupled into propagating light through the central hole. We show that the SW-assisted optical component and the direct transmission component of the central hole can cancel each other, resulting in near-zero transmission under uniform illumination (observed suppression factor of 1230). This structure can therefore be used to suppress a light field's bright background and allow sensitive detection of localized light field non-uniformity (observed image contrast enhancement of 27dB). We also show that under a coherent background illumination, a CMOS pixel patterned with the proposed structure achieves better SNR performance than an un-patterned single pixel.
机译:在生物学实验中,由于存在压倒性的背景信号,很容易使芯片上的弱光信号检测复杂化,因此,预检测背景抑制对于弱信号检测至关重要。在本文中,我们报告了一种可以直接结合到光学传感器上以在检测之前完成背景抑制的结构。这种结构称为表面波使能暗场孔径(SWEDA),由中央亚波长孔组成,该孔被铣削到金层上的同心凹槽围绕。入射光可以通过同心凹槽收集并转换为表面波(SW),然后通过中心孔重新耦合为传播光。我们显示,SW辅助光学组件和中心孔的直接透射组件可以互相抵消,从而在均匀照明下(观察到的抑制因子为1230)实现了接近零的透射。因此,该结构可用于抑制光场的明亮背景,并可以灵敏地检测到局部光场的不均匀性(观察到的图像对比度增强了27dB)。我们还表明,在相干背景照明下,与未构图的单个像素相比,使用所提出的结构构图的CMOS像素可实现更好的SNR性能。

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