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High-resolution diffuse X-ray scattering study of defect structure in silicon single crystals by exploring reciprocal space around different lattice points with a four-crystal X-ray diffractometer

机译：用四晶体X射线衍射仪探讨不同晶格点的往复空间硅单晶缺陷结构的高分辨率漫射X射线散射研究

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K. Lal; G. Bhagavannarayana;
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年度 1987
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1. AN ESTIMATE OF THE UNCERTAINTY OF MEASUREMENTS OF LATTICE SPACINGS IN SILICON SINGLE CRYSTALS USING A LABORATORY X-RAY DIFFRACTOMETER [J] . V. P. Gavrilenko, M. A. Ermakova, A. V. Zablotskii, Measurement techniques . 2014,第12期

机译：实验室X射线衍射仪估算单晶硅晶格间距的不确定度。
2. Point defect clusters in Pb1-xInxTe single crystals revealed by X-ray diffuse scattering method [J] . Zlomanov VP., Tkalich AK., Chtcherbatchev KD. International Journal of Quantum Chemistry . 1998,第1期

机译：X射线扩散散射法揭示Pb1-xInxTe单晶中的点缺陷簇
3. Neutron and x-ray scattering study of phonon dispersion and diffuse scattering in (Na,Bi)TiO_3-xBaTiO_3 single crystals near the morphotropic phase boundary [J] . Chengtao Luo, Dipanshu Bansal, Jiefang Li, Physical review. B, Condensed Matter And Materals Physics . 2017,第17期

机译：（Na，Bi）TiO_3-xBaTiO_3单晶在趋晶相边界附近的声子扩散和散射的中子和X射线散射研究
4. Study of the Stability of 3C-SiC Single Crystals Using High-Resolution Diffuse X-Ray Scattering [C] . D. Dompoint, A. Boulle, I. G.Galben-Sandulache, Symposium on Wide Bandgap Cubic Semiconductors: From Growth to Devices . 2010

机译：使用高分辨率弥漫X射线散射的3C-SiC单晶的稳定性研究
5. STRUCTURAL PHASE TRANSITIONS IN DIGENITE (SOLAR CELLS, SINGLE CRYSTAL, IONIC CONDUCTIVITY, DIFFUSE X-RAY SCATTERING) [D] . GRAY, JOSEPH NAHUM 1985

机译：异形岩中的结构相变（太阳能电池，单晶，离子电导率，X射线散射散射）
6. The optics of focusing bent-crystal monochromators on X-ray powder diffractometers with application to lattice parameter determination and microstructure analysis [O] . Marcus H. Mendenhall, David Black, James P. Cline -1

机译：X射线粉末衍射仪上聚焦弯曲晶体单色仪的光学及其在晶格参数确定和微结构分析中的应用
7. Systematic study of the structure of Ni2MnGa single crystals by high-resolution X-ray diffraction reciprocal space mapping [O] . Petr Cejpek, Václav Holý, Oleg Heczko 2015

机译：高分辨率X射线衍射互易空间测绘的Ni2mnga单晶结构的系统研究
8. A VACUUM PATH X-RAY DIFFRACTOMETER FOR PRECISION RELATIVE LATTICE PARAMETER MEASUREMENTS ON SINGLE CRYSTALS [R] . KRAMER, K., FEDER, R., DYER, R 1966

机译：真空路径X射线衍射仪用于精确相对格子参数的单晶测量

High-resolution diffuse X-ray scattering study of defect structure in silicon single crystals by exploring reciprocal space around different lattice points with a four-crystal X-ray diffractometer

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