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Development of a New Focused Ion Beam Preparation Method of Thin Film for TEM with FIB: A Method Capable of Re-thinning After TEM Observation

机译：具有FIB的TEM薄膜新聚焦离子束制备方法的研制：TEM观察后能够重新稀释的方法

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Toshiaki Suzuki; Masateru Sibata; Eiji Okunishi; Noriaki Endo; Toshiko Kuba;
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年度 2004
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3. Experimental method for determining Cliff-Lorimer factors in transmission electron microscopy (TEM) utilizing stepped wedge-shaped specimens prepared by focused ion beam (FIB) thinning [J] . David M. Longo, James M. Howe, William C. Johonson Ultramicroscopy . 1999,第2期

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Development of a New Focused Ion Beam Preparation Method of Thin Film for TEM with FIB: A Method Capable of Re-thinning After TEM Observation

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