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X-ray Photoelectron Spectroscopy, Time-of-Flight Secondary Ion Mass Spectrometry, and Principal Component Analysis of the Hydrolysis, Regeneration, and Reactivity of N-Hydroxysuccinimide-Containing Organic Thin Films

机译：X射线光电子能谱，飞行时间二次离子质谱，以及含N-羟基琥珀酰亚胺的有机薄膜的水解，再生和反应性的主要成分分析

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Fang Cheng; Lara J. Gamble; David W. Grainger; David G. Castner;
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年度 2007
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机译：飞行时间二次离子质谱，X射线光电子能谱和聚焦离子束/ SEM耦合研究薄膜Si电极的锂插入机理
2. Mechanisms of enhanced lithium intercalation into thin film V2O5 in ionic liquids investigated by X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry [J] . Santos Luis, Swiatowska Jolanta, Lair Virginie, Journal of power sources . 2017,第octa1期

机译：X射线光电子能谱和飞行时间二次离子质谱研究了离子液体中锂嵌入薄膜V2O5的增强机理
3. Self-compensation in ZnO thin films: An insight from X-ray photoelectron spectroscopy, Raman spectroscopy and time-of-flight secondary ion mass spectroscopy analyses [J] . K.G. Saw, K. Ibrahim, Y.T. Lim, Thin Solid Films . 2007,第5期

机译：ZnO薄膜中的自补偿：从X射线光电子能谱，拉曼光谱和飞行时间二次离子质谱分析获得的见解
4. Insights on Semiconductor-Metal Transition in Indium-doped Zinc Oxide from X-ray Photoelectron Spectroscopy, Time-of-flight Secondary Ion Mass Spectrometry and X-ray Diffraction [C] . K.G. Saw, N.M. Aznan, F.K. Yam, International Conference on Nano-Electronic Technology Devices and Material . 2016

机译：X射线光电子谱，飞行时间二次离子质谱和X射线衍射中掺杂掺杂氧化锌中半导体金属转变的见解
5. Applications of time-of-flight secondary ion mass spectrometry (TOF-SIMS) and X-ray photoelectron spectroscopy (XPS) to study interactions of genetically engineered proteins with noble metal films. [D] . Suzuki, Noriaki. 2006

机译：飞行时间二次离子质谱（TOF-SIMS）和X射线光电子能谱（XPS）在研究遗传工程蛋白与贵金属膜之间的相互作用中的应用。
6. X-ray Photoelectron Spectroscopy Time-of-flight Secondary Ion Mass Spectrometry and Principal Component Analysis of the Hydrolysis Regeneration and Reactivity of NHS-containing Organic Thin Films [O] . Fang Cheng, Lara J. Gamble, David W. Grainger, -1

机译：X射线光电子能谱飞行时间二次离子质谱法和含NHS的有机薄膜的水解再生和反应性的主成分分析
7. X-ray Photoelectron Spectroscopy, Time-of-Flight Secondary Ion Mass Spectrometry, and Principal Component Analysis of the Hydrolysis, Regeneration, and Reactivity of N-Hydroxysuccinimide-Containing Organic Thin Films [O] . -1

机译：X射线光电子能谱，飞行时间二次离子质谱，以及含N-羟基琥珀酰亚胺的有机薄膜的水解，再生和反应性的主要成分分析

X-ray Photoelectron Spectroscopy, Time-of-Flight Secondary Ion Mass Spectrometry, and Principal Component Analysis of the Hydrolysis, Regeneration, and Reactivity of N-Hydroxysuccinimide-Containing Organic Thin Films

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