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Quantification of electron accumulation at grain boundaries in perovskite polycrystalline films by correlative infrared-spectroscopic nanoimaging and Kelvin probe force microscopy

机译：通过相关红外光谱纳米瘤和开尔文探针显微镜测量钙钛矿多晶膜中晶界晶界中的电子积累

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Ting-Xiao Qin; En-Ming You; Mao-Xin Zhang; Peng Zheng; Xiao-Feng Huang; Song-Yuan Ding; Bing-Wei Mao; Zhong-Qun Tian;
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1. Quantification of electron accumulation at grain boundaries in perovskite polycrystalline films by correlative infrared-spectroscopic nanoimaging and Kelvin probe force microscopy [J] . Ting-Xiao Qin, En-Ming You, Mao-Xin Zhang, 光：科学与应用（英文版） . 2021,第005期

机译：通过相关红外光谱纳米瘤和开尔文探针显微镜测量钙钛矿多晶膜中晶界晶界中的电子积累
2. Measurements of potential barrier height of grain boundaries in polycrystalline silicon by Kelvin probe force microscopy [J] . S. Tsurekawa, K. Kido, T. Watanabe Philosophical Magazine Letters . 2005,第1期

机译：用开尔文探针力显微镜测量多晶硅中晶界的势垒高度
3. Potential variation around grain boundaries in BaSi2 films grown on multicrystalline silicon evaluated using Kelvin probe force microscopy [J] . Baba Masakazu, Hara Kosuke O., Tsukahara Daichi, Journal of Applied Physics . 2014,第23期

机译：使用开尔文探针力显微镜评估在多晶硅上生长的BaSi 2 薄膜中晶界周围的电位变化
4. Characterization of grain boundary properties in BaSi2 epitaxial films on Si(111) and Si(001) by Kelvin probe force microscopy [C] . Baba M., Tsurekawa S., Nakamura K., IEEE Photovoltaic Specialists Conference . 2013

机译：用开尔文探针力显微镜表征Si（111）和Si（001）上BaSi2外延膜的晶界特性
5. Structure-property analysis of perovskite grain boundaries by scanning transmission electron microscopy. [D] . Buban, James Paul. 2003

机译：通过扫描透射电子显微镜对钙钛矿晶界的结构性质分析。
6. Quantification of electron accumulation at grain boundaries in perovskite polycrystalline films by correlative infrared-spectroscopic nanoimaging and Kelvin probe force microscopy [O] . Ting-Xiao Qin, En-Ming You, Mao-Xin Zhang, 2021

机译：通过相关红外光谱纳米瘤和开尔文探针显微镜测量钙钛矿多晶膜中晶界晶界中的电子积累
7. The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band bending in perovskite and Cu(In,Ga)Se2 solar cells [O] . Evandro Martin Lanzoni, Thibaut Gallet, Conrad Spindler, 2021

机译：开尔文探测力显微镜操作模式和环境对钙钛矿和Cu（GA）SE2太阳能电池晶界带弯曲的影响

Quantification of electron accumulation at grain boundaries in perovskite polycrystalline films by correlative infrared-spectroscopic nanoimaging and Kelvin probe force microscopy

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