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Characterization of a Lubricant Film in a Wearing Region on a Thin-Film Magnetic Recording Disk by Time-of-Flight Secondary Ion Mass Spectrometry.

机译：通过飞行时间二次离子质谱法在薄膜磁记录盘上磨损区域中的润滑膜的表征。

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T. Amemiya; N. Yoshino; Y. Umeda; Y. Nihei;
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年度 1995
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1. Characterization of lubricant films on magnetic recording disks by ToF-SIMS [J] . Abe Y., Matsuo T., Shibayama M. Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films . 2000,第1期

机译：用ToF-SIMS表征磁记录盘上的润滑膜
2. Properties of diamond-like carbon film and its application as a protective layer in thin-film magnetic recording disks [J] . Kokaku Y., Matsumoto H. IEEE Transactions on Magnetics . 1993,第6期

机译：类金刚石碳膜的特性及其在薄膜磁记录盘中作为保护层的应用
3. Friction/stiction and wear studies of magnetic thin-film disks with two polar perfluoropolyether lubricants [J] . Bhushan B., Zheming Zhao IEEE Transactions on Magnetics . 1997,第1期

机译：含两种极性全氟聚醚润滑剂的磁性薄膜磁盘的摩擦/静摩擦和磨损研究
4. Friction/Stiction And Wear Studies Of Magnetic Thin-film Disks With Two Polar Perfluoropolyther Lubricants [C] . Bhushan, B., Zheming Zhao . 2001

机译：含两种极性全氟聚醚润滑剂的磁性薄膜磁盘的摩擦/静摩擦和磨损研究
5. Time-of-flight secondary ion mass spectrometry (ToF-SIMS) characterization of conformation and orientation of adsorbed protein films. [D] . Xia, Nan. 2003

机译：飞行时间二次离子质谱（ToF-SIMS）表征吸附蛋白膜的构象和方向。
6. Analysis of lung surfactant model systems with time-of-flight secondary ion mass spectrometry. [O] . N Bourdos, F Kollmer, A Benninghoven, 2000

机译：飞行时间二次离子质谱分析肺表面活性剂模型系统。
7. Effects of Lubricants and Their Treatments on Tribological Characteristics of Thin-Film Disks [O] . Toshihito Hiraide, Masakazu Aoki, Youichi Kawakubo 2008

机译：润滑剂的影响及其治疗对薄膜盘的摩擦学特性
8. Method Development and Validation of Comparative Finished Fiber Analysis Using Nano-Sampling Cryomicrotomy and Time-of-Flight Secondary Ion Mass Spectrometry. [R] . C. Zhou D. Griffis D. Hinks K. Beck 2014

机译：利用纳米采样低温切片和飞行时间二次离子质谱进行比较成品纤维分析的方法开发和验证。

Characterization of a Lubricant Film in a Wearing Region on a Thin-Film Magnetic Recording Disk by Time-of-Flight Secondary Ion Mass Spectrometry.

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