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Direct measurement of the electrostatic image force of a levitated charged nanoparticle close to a surface

机译:直接测量浮动带电纳米粒子靠近表面的静电图像力

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摘要

Short-range forces have important real-world relevance across a range ofsettings in the nano world, from colloids and possibly for protein folding tonano-mechanical devices, but also for detection of weak long-range forces, suchas gravity, at short distances and of candidates to solve the problem of darkenergy. Short-range forces, such as Casimir-Polder or van der Waals are ingeneral difficult to calculate as a consequence of their non-additive nature,and challenging to measure due to their small magnitude - especially forcharged particles where dispersion forces are normally many orders of magnitudesmaller than electrostatic image forces. Therefore short-range forces haverepresented a continuing theoretical and experimental challenge over the lasthalf-century. Here we report on experiments with a single glass nanoparticlelevitated in close proximity to a neutral silicon surface in vacuum, whichallow for direct measurement of short-range forces in a new distance andsensitivity regime - outperforming existing force microscopies.
机译:短程力量在纳米世界的一个范围内具有重要的真实关系,从胶体中,来自胶体和可能用于蛋白质折叠的蛋白质 - 机械装置,而且还用于检测弱远程力,如短的远距离和候选人解决​​黑暗的问题。基本型力,如Casimir-Polder或Van der Waals是难以作为它们的非添加性性质的结果计算的,并且由于它们的小幅度而挑战测量 - 特别是多重粒子,其中分散力通常是许多订单比静电图像力的刻度。因此,短程力量对Lasthalf世纪的持续理论和实验挑战持续了持续的理论和实验挑战。在这里,我们在真空中与中性硅表面紧密接近的单个玻璃纳米颗粒的实验报告,在新距离和敏感度方案中,围绕用于直接测量的短距离力 - 优于现有力显微镜。

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